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Bruker Corporation's Film Thickness Meters

Bruker Corporation

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Sirius RF-T, high-speed XRR & XRF measurement device for evaluating metal film thickness and composition of patterned wafers-Bruker Corporation

Bruker Corporation

Sirius RF-T, high-speed XRR & XRF measurement device for evaluating metal film thickness and composition of patterned wafers

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■High-speed XRP&XRF measurement for metal film thickness and composition evaluation of patterned wafers The Bruker Sirius RF-T is the successor to ...



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