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  4. Park Systems Japan Co., Ltd.

Park Systems Japan Co., Ltd.'s Ellipsometers

Park Systems Japan Co., Ltd.

4 products found

Visualize thin films Imaging ellipsometer Accurion EP4-Park Systems Japan Co., Ltd.

Park Systems Japan Co., Ltd.

Visualize thin films Imaging ellipsometer Accurion EP4

240+ people viewing

Standard Response

Response Rate
100.0 %
Response Time
26.4 hours

Imaging Ellipsometer EP4 is a product that combines ellipsometry and microscopy. EP4 can evaluate optical properties such as thin film thickness a...


Referenced Spectroscopic Ellipsometer: RSE-Park Systems Japan Co., Ltd.

Park Systems Japan Co., Ltd.

Referenced Spectroscopic Ellipsometer: RSE

250+ people viewing

Last viewed: 11 hours ago

Standard Response

Response Rate
100.0 %
Response Time
26.4 hours

The Referenced Spectroscopic Ellipsometer (RSE) is an ellipsometer-based reflectance meter designed for high-speed film thickness measurements in q...


Surface Inspection Metrology of Nanofilms (SIMON)-Park Systems Japan Co., Ltd.

Park Systems Japan Co., Ltd.

Surface Inspection Metrology of Nanofilms (SIMON)

250+ people viewing

Last viewed: 14 hours ago

Standard Response

Response Rate
100.0 %
Response Time
26.4 hours

SIMON is specially designed for regular measurement tasks in imaging ellipsometry. The simple user interface and robustness of the fixed-angle ell...


Live view overview Brewster angle microscope Accurion UltraBAM-Park Systems Japan Co., Ltd.

Park Systems Japan Co., Ltd.

Live view overview Brewster angle microscope Accurion UltraBAM

210+ people viewing

Last viewed: 1 day ago

Standard Response

Response Rate
100.0 %
Response Time
26.4 hours

The UltraBAM is a Brewster angle microscope designed for gas-liquid interface measurements. It can also be used on solid substrates such as glass a...



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