Park Systems Japan Co., Ltd.'s Ellipsometers
Park Systems Japan Co., Ltd.4 products found
Park Systems Japan Co., Ltd.
Visualize thin films Imaging ellipsometer Accurion EP4
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Last viewed: 17 hours ago
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100.0% Response Rate
0.8hours Response Time
Imaging Ellipsometer EP4 is a product that combines ellipsometry and microscopy. EP4 can evaluate optical properties such as thin film thickness a...
Park Systems Japan Co., Ltd.
Referenced Spectroscopic Ellipsometer: RSE
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Last viewed: 17 hours ago
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100.0% Response Rate
0.8hours Response Time
The Referenced Spectroscopic Ellipsometer (RSE) is an ellipsometer-based reflectance meter designed for high-speed film thickness measurements in q...
Park Systems Japan Co., Ltd.
Surface Inspection Metrology of Nanofilms (SIMON)
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Last viewed: 12 minutes ago
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100.0% Response Rate
0.8hours Response Time
SIMON is specially designed for regular measurement tasks in imaging ellipsometry. The simple user interface and robustness of the fixed-angle ell...
Park Systems Japan Co., Ltd.
Live view overview Brewster angle microscope Accurion UltraBAM
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Last viewed: 12 hours ago
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100.0% Response Rate
0.8hours Response Time
The UltraBAM is a Brewster angle microscope designed for gas-liquid interface measurements. It can also be used on solid substrates such as glass a...
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