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4 products found
Park Systems Japan Co., Ltd.
340+ people viewing
Last viewed: 19 hours ago
Imaging Ellipsometer EP4 is a product that combines ellipsometry and microscopy. EP4 can evaluate optical properties such as thin film thickness a...
Park Systems Japan Co., Ltd.
320+ people viewing
The Referenced Spectroscopic Ellipsometer (RSE) is an ellipsometer-based reflectance meter designed for high-speed film thickness measurements in q...
Park Systems Japan Co., Ltd.
320+ people viewing
Last viewed: 10 hours ago
SIMON is specially designed for regular measurement tasks in imaging ellipsometry. The simple user interface and robustness of the fixed-angle ell...
Park Systems Japan Co., Ltd.
260+ people viewing
The UltraBAM is a Brewster angle microscope designed for gas-liquid interface measurements. It can also be used on solid substrates such as glass a...
