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X-ray diffractometer D8 ADVANCE Plus-D8 ADVANCE Plus
X-ray diffractometer D8 ADVANCE Plus-Cosmo Trading Co., Ltd.

X-ray diffractometer D8 ADVANCE Plus
Cosmo Trading Co., Ltd.

Cosmo Trading Co., Ltd.'s Response Status

Response Rate

100.0%

Response Time

24.3hours

Relatively Fast Response


About This Product

D8 ADVANCE Plus is the ultimate X-ray platform for versatile, multi-user labs. The system perfectly matches the needs of all sample types, including powders, bulk materials, fibers, sheets, and thin films (amorphous, polycrystalline, and epitaxial).

■Features

・Conventional X-ray powder diffraction (XRD) ・Bibody distribution function (PDF) analysis ・Small-angle X-ray scattering ・Wide-angle X-ray diffraction (SAXS, WAXS) ・XRR (X-ray reflectance measurement) and high-resolution X-ray diffraction (HRXRD), rocking curve, reciprocal lattice mapping ・Under controlled atmosphere or atmospheric atmosphere The real appeal of this system is that up to six types of optical system combinations, from the Bragg-Brentano focused optical system for powders to the Kα1 high-resolution parallel beam optical system for epitaxial thin films, can be combined using only software operations. It's about being able to switch. Regardless of sample type or application, it can be used for a wide range of applications, whether you are a beginner or an expert. D8 ADVANCE Plus sets a new standard in data quality with its unmatched flexibility and ease of use.

■TRIO optical system

The patented TRIO optical system simplifies the use of the D8 ADVANCE and enables the most diverse applications and sample types. For user convenience, up to 6 types of optical systems can be automatically switched. The system can switch between three beam paths without manual adjustment by the user. ・Bragg-Brentano focusing optical system for powder samples ・High-intensity Kα1,2 parallel beam optical system for XRR, GID, and capillary measurements ・Kα1 parallel beam optical system for high-resolution XRD of epitaxial thin films, etc. Ideal for controlled or atmospheric measurements of all sample types including powders, bulks, fibers, sheets, and thin films (amorphous, polycrystalline, epitaxial).

  • Product

    X-ray diffractometer D8 ADVANCE Plus

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1 Models of X-ray diffractometer D8 ADVANCE Plus

Image Part Number Price (excluding tax) Atmosphere control attachment Central axis Compact cradle plus Compact UMC stage TWIST-TUBE TWIN/TRIO optical system TRIO optical system LYNXEYE XE-T detector EIGER2 R 500K count rate EIGER 2R D8 goniometer
X-ray diffractometer D8 ADVANCE Plus-Part Number-D8 ADVANCE Plus

D8 ADVANCE Plus

Available upon quote

Control temperature range: -188 ~ 2,300℃
Control pressure range: 10^-4 mbar ~ 10 bar (7.5×10^-4 Torr ~ 7.5×10^3 Torr)

4

Electric Phi: Unlimited
Electric pressure: -5° to 95°

Electric X: 25mm
Electric Y: 70mm
Electric Z: 52mm
Capacity: 2kg

Quick switching mechanism between line focus and point focus without alignment

3x2

Software Push-Button switching:
Motorized variable divergence slit (Bragg-Brentano focusing optical system)
High strength parallel mirror (Kα1,2 parallel beam optical system)

Maximum energy resolution: < 380 eV @ 8 keV (at 25°C, half-width)
Detection mode: 0D, 1D, 2D
Compatible wavelengths: Cr, Co, Cu, Mo, Ag

>1x10^12 photons/s

Multi-mode detector (0D / 1D / 2D modes) based on the latest hybrid photon counting (HPC) technology

Stepper motor controlled 2-axis goniometer with optical encoder

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About Company Handling This Product

Response Rate

100.0%


Response Time

24.3hrs


Company Review

4.0
  • Japan

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