World's smallest lightweight portable type X-ray residual stress measuring device μ-X360s
Pulstech Industry

feature Small, lightweight, non -destruction, high -speed measurement is realized. Efficient measurements can be performed by detecting diffracting ring data by single -in -one. ･ Felite measurement is about 60 seconds and high speed ･ High reliability to acquire data from the entire circumference of the diffraction ring ･ Easy set of structures for single incidence (51mm ± 16mm) ･ Measurement of on -site and relatively narrow parts ･ X -ray output is 30kV ･ 1.5mA, which is low output with low output. ･ World's smallest size ･ Lighter, carried around anywhere ･ User exchange of X -ray tube can be replaced Case Study ･ Common scale of problem solving / management ･ Visualization of crystal state ･ Remaining austenite ･ Shot pilling effect ･ Relationship between half -value width and crystal particle size Measurement principle Overview of the COSα method By acquiring the entire device ring and finding the difference from the device ring of the measured sample based on the powerless sample, Calculate residual stress, and add the rotation angle of the device ring to the calculation in addition to the sin2ψ method. The COSα method is OK even if the sample distance is rough The size of the device ring changes according to the sample distance It can be measured if the device ring is fit in the 2D detector