Lens unit wave surface measurement system Lucas-Lens unit wave surface measurement system LUCAS1 / 2 inch
Lens unit wave surface measurement system Lucas-Pulstech Industry

Lens unit wave surface measurement system Lucas
Pulstech Industry


About This Product

Stable real -time wave surface measurement can be realized in a free configuration Feature ・ Lucas-Nuk A system that realizes stable real -time swelling measurement at a low price. The height of the height is wide, and the swell that is difficult to measure at one time can be measured with a white interference meter. Small and lightweight and can be used by incorporating it into various devices. Real -time [0.1Sec (MAX)] Nulling measurement can be performed. ・ Lucas Lens unit inspection and adjustment system. You can also measure large aberrations that have a wide dynamic range and are difficult with interferometer. The base unit has a laser light source that can be used as an autocolimeter, measuring light, and an alignment camera that makes it easier to adjust in addition to the wave surface sensor. If necessary, you can select various accessories (beam expanda, light -integrated lens, reference spherical surface, etc.). Example of use ・ Lucas-Nuk Semiconductor wafer swell measurement Swelling of the metal thin film on the plane substrate Swelling measurement of metal surface and glass surface Hard disk surface swell measurement ・ Lucas Inspection of non -sphere lenses and uneven lenses Adjustment of lens units and optical devices Reflection of flat objects, test of transmitted surface surface

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    Lens unit wave surface measurement system Lucas




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2 Models of Lens unit wave surface measurement system Lucas

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Product Image Part Number Price (excluding tax) Data update speed Interface Measurement -effective diameter (when using double EXP) Measurement accuracy Measurement reproducibility Measurement wavelength Measurement with effective diameter Measurement with effective diameter (when using 3 times EXP) Operating temperature Spatial resolution size weight
Lens unit wave surface measurement system Lucas-Part Number-Lens unit wave surface measurement system LUCAS1 / 2 inch

Lens unit wave surface measurement system LUCAS1 / 2 inch

Available upon quote 20Hz (MAX) IEEE1394 (6pin) φ8.0-18.4mm <1/100λrms (3σ) <1/500λrms (3σ) 635mm (incidentable wavelength range: 400-800Nm) φ4.0-9.6mm φ12.0-27.5mm 15-35 ℃ 180 μm (Typ.) 180 × 330 × 130mm (W × D × H) 7.2kg (base unit)
Lens unit wave surface measurement system Lucas-Part Number-Lens unit wave surface measurement system LUCAS2 / 3 inch

Lens unit wave surface measurement system LUCAS2 / 3 inch

Available upon quote 10Hz (MAX) IEEE1394 (6pin) φ16.0-25.6mm <1/100λrms (3σ) <1/300λrms (3σ) 635mm (incidentable wavelength range: 400-800Nm) φ8.0-12.8mm φ24.0-38.4mm 15-35 ℃ 300μm (Typ.) 180 × 330 × 130mm (W × D × H) 7.2kg (base unit)

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