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History
Response Rate
100.0%
Response Time
30.7hours
Relatively Fast Response
Product
Sirius RF-T, high-speed XRR & XRF measurement device for evaluating metal film thickness and composition of patterned wafersHandling Company
Bruker CorporationCategories
Image | Part Number | Price (excluding tax) |
---|---|---|
Sirius RF |
Available upon quote |
Reviews shown here are reviews of companies.
Reviews shown here are reviews of companies.