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  4. Fully automatic/multipurpose XRD device for thin film analysis JV-DX (Bruker Corporation)
Fully automatic/multipurpose XRD device for thin film analysis JV-DX-JV-DX
Fully automatic/multipurpose XRD device for thin film analysis JV-DX-Bruker Corporation

Fully automatic/multipurpose XRD device for thin film analysis JV-DX
Bruker Corporation

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■Fully automatic/multipurpose XRD device for thin film analysis

The Bruker JV-DX instrument is the latest instrument that can fully automate all measurement techniques used in thin film X-ray analysis. The input optical system and receiving optical system are fully automated, allowing measurements to be automatically switched between wide-angle XRD, high-resolution XRD, and X-ray reflectance without user intervention. Measurements are fully automated within the recipe, ranging from qualitative analysis of crystalline phases, polar point analysis to determine crystal orientation, low angle incidence (thin film method) to measure extremely thin films, to measurement of film thickness, density, and roughness using XRR. Fully automatic measurements including composition and film thickness measurements using high-resolution XRD are possible. You can perform even more difficult measurements by selecting semi-manual mode. The sample stage supports full-surface mapping of 300mm wafers, and can also be combined with an automatic wafer transfer robot.

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    Fully automatic/multipurpose XRD device for thin film analysis JV-DX

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1 Models of Fully automatic/multipurpose XRD device for thin film analysis JV-DX

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Fully automatic/multipurpose XRD device for thin film analysis JV-DX-Part Number-JV-DX

JV-DX

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Bruker Corporation

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Response Time

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Company Overview

Bruker, founded in 1960 and based in Billerica, Massachusetts, is a manufacturer and distributor of scientific...

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