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  4. Detector Xplore for routine analysis in SEM (Oxford Instruments Ltd.)
Detector Xplore for routine analysis in SEM-Xplore
Detector Xplore for routine analysis in SEM-Oxford Instruments Ltd.

Detector Xplore for routine analysis in SEM
Oxford Instruments Ltd.

Oxford Instruments Ltd.'s Response Status

Response Rate

100.0%

Response Time

26.3hours

Relatively Fast Response

About This Product

Xplore is a next generation EDS detector ideal for routine analysis in SEM. The detector has a sensor area of ​​30mm2 and 15mm2 and is designed for a variety of applications. Xplore uses several new technologies introduced in the large area detector Ultim Max. They enable data collection for live EDS analysis and automatically obtain the reliable results required for routine analytical applications. Main features

■Speed

By combining Extreme electronics and the X1 pulse processor, Xplore delivers map analysis at count rates of 1,000,000 cps and accurate compositional analysis at 100,000 cps.

■Sensitivity

The new compact design has a smaller footprint and enables on-site repair work to reduce repair time and maximize uptime.

■Extreme Electronics

Xplore features proven Extreme electronics for noise-reduced detector and signal processing. Excellent energy resolution and high-quality spectral collection are possible even at high count rates, achieving a Mn Kα energy resolution of 129 eV at 100,000 cps.

  • Product

    Detector Xplore for routine analysis in SEM

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1 Models of Detector Xplore for routine analysis in SEM

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Detector Xplore for routine analysis in SEM-Part Number-Xplore

Xplore

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About Company Handling This Product

Oxford Instruments Ltd.

Response Rate

100.0%

Response Time

26.3hrs

  • Japan

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X-Ray Fluorescence (XRF) Analyzers
X-Ray Fluorescence (XRF) Analyzers　Oxford Instruments Ltd.
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