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  4. Windowless Silicon Drift Detector Sensor X-MaxN TSR (Oxford Instruments Ltd.)
Windowless Silicon Drift Detector Sensor X-MaxN TSR-X-MaxN TSR
Windowless Silicon Drift Detector Sensor X-MaxN TSR-Oxford Instruments Ltd.

Windowless Silicon Drift Detector Sensor X-MaxN TSR
Oxford Instruments Ltd.

Oxford Instruments Ltd.'s Response Status

Response Rate

100.0%

Response Time

26.3hours

Relatively Fast Response

About This Product

■Summary

-This windowless silicon drift detector sensor for TEM applications can achieve detection solid angles ranging from 0.3 to 0.7 steradians. - Superior detection efficiency across the spectral range, especially for light elements, means higher count rates in all energy regions. - Depends on configuration, pole piece and TEM. -The most important measurement of a TEM detector's performance is its solid angle. -Solid angle varies depending on microscope and pole piece design. ・X-MaxN TSR optimizes the distance between the crystal and sample to maximize the solid angle.

■Features

・Suitable for conventional 200kV field emission TEM ・Three times the light element collection efficiency ・Uncompromised low energy detection performance, peak-to-background ratio, and resolution

  • Product

    Windowless Silicon Drift Detector Sensor X-MaxN TSR

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1 Models of Windowless Silicon Drift Detector Sensor X-MaxN TSR

Image Part Number Price (excluding tax)
Windowless Silicon Drift Detector Sensor X-MaxN TSR-Part Number-X-MaxN TSR

X-MaxN TSR

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About Company Handling This Product

Oxford Instruments Ltd.

Response Rate

100.0%

Response Time

26.3hrs

  • Japan

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X-Ray Fluorescence (XRF) Analyzers
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Oxford Instruments Ltd.

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