Windowless Silicon Drift Detector Sensor X-MaxN TSR
Oxford Instruments Ltd.
About This Product
■Summary
-This windowless silicon drift detector sensor for TEM applications can achieve detection solid angles ranging from 0.3 to 0.7 steradians.
- Superior detection efficiency across the spectral range, especially for light elements, means higher count rates in all energy regions.
- Depends on configuration, pole piece and TEM.
-The most important measurement of a TEM detector's performance is its solid angle.
-Solid angle varies depending on microscope and pole piece design.
・X-MaxN TSR optimizes the distance between the crystal and sample to maximize the solid angle.
■Features
・Suitable for conventional 200kV field emission TEM
・Three times the light element collection efficiency
・Uncompromised low energy detection performance, peak-to-background ratio, and resolution
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Product
Windowless Silicon Drift Detector Sensor X-MaxN TSR
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Handling Company
Oxford Instruments Ltd.
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Categories
1 Models of Windowless Silicon Drift Detector Sensor X-MaxN TSR
| Product Image | Part Number | Price (excluding tax) |
|---|---|---|
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X-MaxN TSR |
Available upon quote |
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About Company Handling This Product
- Japan