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  4. SDD X-MaxN 80T for TEM (Oxford Instruments Ltd.)
SDD X-MaxN 80T for TEM-X-MaxN 80T
SDD X-MaxN 80T for TEM-Oxford Instruments Ltd.

SDD X-MaxN 80T for TEM
Oxford Instruments Ltd.

About This Product

The X-MaxN series of SDDs for TEM leverages new sensor elements, new electronics, and innovative packaging to deliver truly "next generation" SDD performance.

■Features

-The X-MaxN TEM detector uses a state-of-the-art, low-noise detector design that provides excellent resolution and sensitivity even at high count rates. -Specially designed for routine TEM applications, the X-MaxN 80 T large area 80 mm2 sensor provides excellent solid angle and analytical performance. - Designed to maximize throughput and sensitivity at low energy. ・It has excellent resolution at 50,000 cps. (Performance guaranteed with Mn) Optimized extraction angle for best peak/background ratio and light element detection. ・Proven performance in all classes of TEM, including field-emission and aberration-corrected microscopes - Counting rates leading to rapid acquisition of X-ray maps, including real-time background removal and peak deconvolution using AZtecTEM TruMap software

■Importance of using large sensors

・Productive counting rate even at low electron beam currents ・Maximize imaging performance and accuracy ・No need to change imaging conditions for X-ray analysis - Significantly higher counting rate with the same electron beam current ・Reduced data acquisition time ・Better statistical reliability ・Practical analysis with small electron beam diameter ・Maximize spatial resolution ・Make the most of high-resolution TEM

  • Product

    SDD X-MaxN 80T for TEM

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1 Models of SDD X-MaxN 80T for TEM

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SDD X-MaxN 80T for TEM-Part Number-X-MaxN 80T

X-MaxN 80T

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Oxford Instruments Ltd.

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