SDD detector for TEM X-MaxN 100TLE
Oxford Instruments Ltd.
About This Product
The X-MaxN 100TLE TEM SDD detector is the ideal solution for field emission and aberration corrected TEM applications at the forefront of nanoscience.
■Features
・Even under the conditions used to analyze nanoscale impurities and dopants using conventional detectors, elements at lower concentrations can be detected.
- Collect more data before electron beam-sensitive samples are destroyed, enabling a new level of nanoparticle and nanotube analysis.
■Excellent performance
・Maximize count rate at nanoscale or picoscale
・With a unique sensor design, the sensor with an effective area of 100mm2 gets closer to the sample and achieves an ultra-high solid angle.
・Windowless configuration ensures highest sensitivity and unparalleled low-energy X-ray detection for all elements
- Built-in accurate pile-up correction for accurate quantitative analysis even at count rates of 100Kcps or higher
■Excellent practicality
-Easy to incorporate into existing columns
・Automatic retraction mechanism within the flap to prevent damage caused by large amounts of electron beams
・Pressure sensor automatically protects the detector when the vacuum level drops
・Liquid nitrogen free
・No need to tilt the sample for solid angle optimization
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Product
SDD detector for TEM X-MaxN 100TLE
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Handling Company
Oxford Instruments Ltd.
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Categories
1 Models of SDD detector for TEM X-MaxN 100TLE
| Product Image | Part Number | Price (excluding tax) |
|---|---|---|
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X-MaxN 100TLE |
Available upon quote |
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About Company Handling This Product
- Japan