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  4. Windowless EDS detector Ultim® Extreme (Oxford Instruments Ltd.)
Windowless EDS detector Ultim® Extreme-Ultim® Extreme
Windowless EDS detector Ultim® Extreme-Oxford Instruments Ltd.

Windowless EDS detector Ultim® Extreme
Oxford Instruments Ltd.

Oxford Instruments Ltd.'s Response Status

Response Rate

100.0%

Response Time

26.3hours

Relatively Fast Response

About This Product

■Summary

The Ultim Extreme Silicon Drift Detector is a breakthrough solution for ultra-high resolution FEG-SEM applications, enabling solutions that go beyond traditional micro and nano analysis. -Ultim Extreme is a windowless 100 mm2 version of Ultim designed to maximize sensitivity and spatial resolution. -Ultim Extreme employs an advanced configuration to optimize both ultra-high resolution FEG-SEM imaging and EDS performance while operating at low accelerating voltages and short working distances. - When using Ultim Extreme, EDS resolution approaches that of SEM. Features

■Ultimate spatial resolution with SEM-EDS

Elemental analysis below 10nm using FEG-SEM

■Sensitivity to surface science

Surface analysis in SEM

■Material evaluation at extremely low accelerating voltage

Material analysis down to 1kV

■Fastest and most accurate nano analysis

Fastest acquisition and real-time data analysis for bulk samples

■Ultimate light element sensitivity

Dramatically improved detection of elements such as lithium, nitrogen, and oxygen

  • Product

    Windowless EDS detector Ultim® Extreme

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1 Models of Windowless EDS detector Ultim® Extreme

Image Part Number Price (excluding tax)
Windowless EDS detector Ultim® Extreme-Part Number-Ultim® Extreme

Ultim® Extreme

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About Company Handling This Product

Oxford Instruments Ltd.

Response Rate

100.0%

Response Time

26.3hrs

  • Japan

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X-Ray Fluorescence (XRF) Analyzers
X-Ray Fluorescence (XRF) Analyzers　Oxford Instruments Ltd.
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