Windowless EDS detector Ultim® Extreme
Oxford Instruments Ltd.
About This Product
■Summary
The Ultim Extreme Silicon Drift Detector is a breakthrough solution for ultra-high resolution FEG-SEM applications, enabling solutions that go beyond traditional micro and nano analysis.
-Ultim Extreme is a windowless 100 mm2 version of Ultim designed to maximize sensitivity and spatial resolution.
-Ultim Extreme employs an advanced configuration to optimize both ultra-high resolution FEG-SEM imaging and EDS performance while operating at low accelerating voltages and short working distances.
- When using Ultim Extreme, EDS resolution approaches that of SEM.
Features
■Ultimate spatial resolution with SEM-EDS
Elemental analysis below 10nm using FEG-SEM
■Sensitivity to surface science
Surface analysis in SEM
■Material evaluation at extremely low accelerating voltage
Material analysis down to 1kV
■Fastest and most accurate nano analysis
Fastest acquisition and real-time data analysis for bulk samples
■Ultimate light element sensitivity
Dramatically improved detection of elements such as lithium, nitrogen, and oxygen
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Product
Windowless EDS detector Ultim® Extreme
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Handling Company
Oxford Instruments Ltd.
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Categories
1 Models of Windowless EDS detector Ultim® Extreme
| Product Image | Part Number | Price (excluding tax) |
|---|---|---|
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Ultim® Extreme |
Available upon quote |
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About Company Handling This Product
- Japan