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  4. VSA wafer tester realizes shortening of measurement time due to flexibility of measurement conditions (CHUO ELECTRIC WORKS L.T.D)
VSA wafer tester realizes shortening of measurement time due to flexibility of measurement conditions-VSA wafer tester
VSA wafer tester realizes shortening of measurement time due to flexibility of measurement conditions-CHUO ELECTRIC WORKS L.T.D

VSA wafer tester realizes shortening of measurement time due to flexibility of measurement conditions
CHUO ELECTRIC WORKS L.T.D

CHUO ELECTRIC WORKS L.T.D's Response Status

Response Rate

100.0%

Response Time

21.4hours

Relatively Fast Response

About This Product

The frequency characteristics of wafers are inspected using a vector frequency analyzer on the production line. Multiple voltage output settings are possible.

■Features

・Compact by introducing PXI system ・Reduced measurement time due to flexibility in measurement conditions ・Equipped with power sensor calibration function ・You can view the results of the previous process ・Output the results necessary for the next process

■Applications

Inspection of wafer frequency characteristics

■System configuration

・Development language: LabVIEW ・PXIe-1078 chassis ・PXIe-8135 controller ・PXIe-5644R Vector Frequency Analyzer ・PXIe-4144 Source Measure Unit (SMU) ・Prober ・Power meter (sensor) ・Signal source

  • Product

    VSA wafer tester realizes shortening of measurement time due to flexibility of measurement conditions

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1 Models of VSA wafer tester realizes shortening of measurement time due to flexibility of measurement conditions

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VSA wafer tester realizes shortening of measurement time due to flexibility of measurement conditions-Part Number-VSA wafer tester

VSA wafer tester

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About Company Handling This Product

CHUO ELECTRIC WORKS L.T.D

Response Rate

100.0%

Response Time

21.4hrs

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Semiconductor inspection equipment
Semiconductor inspection equipment　CHUO ELECTRIC WORKS L.T.D
CHUO ELECTRIC WORKS L.T.D

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