VSA wafer tester realizes shortening of measurement time due to flexibility of measurement conditions
CHUO ELECTRIC WORKS L.T.D
About This Product
The frequency characteristics of wafers are inspected using a vector frequency analyzer on the production line. Multiple voltage output settings are possible.
■Features
・Compact by introducing PXI system
・Reduced measurement time due to flexibility in measurement conditions
・Equipped with power sensor calibration function
・You can view the results of the previous process
・Output the results necessary for the next process
■Applications
Inspection of wafer frequency characteristics
■System configuration
・Development language: LabVIEW
・PXIe-1078 chassis
・PXIe-8135 controller
・PXIe-5644R Vector Frequency Analyzer
・PXIe-4144 Source Measure Unit (SMU)
・Prober
・Power meter (sensor)
・Signal source
-
Product
VSA wafer tester realizes shortening of measurement time due to flexibility of measurement conditions
-
Handling Company
CHUO ELECTRIC WORKS L.T.D
-
Categories
1 Models of VSA wafer tester realizes shortening of measurement time due to flexibility of measurement conditions
| Product Image | Part Number | Price (excluding tax) |
|---|---|---|
|
|
VSA wafer tester |
Available upon quote |
Customers who viewed this product also viewed
Other products of CHUO ELECTRIC WORKS L.T.D
View more products of CHUO ELECTRIC WORKS L.T.D