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  4. Optical automatic surface inspection system ARGOS matrix (Optoscience Co., Ltd.)
Optical automatic surface inspection system ARGOS matrix-ARGOS matrix
Optical automatic surface inspection system ARGOS matrix-Optoscience Co., Ltd.

Optical automatic surface inspection system ARGOS matrix
Optoscience Co., Ltd.

Optoscience Co., Ltd.'s Response Status

Response Rate

100.0%

Response Time

14.1hours

Relatively Fast Response

About This Product

Automatically detects scratches and dirt on the surfaces of optics, wafers, etc. All measurements are automatic and in accordance with ISO 10110-7, ensuring objective, reproducible and stable measurements independent of operator skill.

■Features

・Can be used to detect surface defects in glass, plastics, metals, semiconductors, etc. ・Create detailed PDF report including detected defect images ・Counts and records particles and defects in areas up to 200mm in diameter in minutes - Can be used to inspect almost any shape of spherical or aspherical surface, and can determine the location of defects in the depth direction with an accuracy of up to 50 µm.

■Specifications

- Works with all size-based specifications related to surface defects up to 5/1 x 0.016 according to ISO 10110-7. ・Highly reliable size measurement is possible from a size of approximately 2.5 µm. ・Inspection of scratches on optics such as mirrors and filters ・Measuring head only, no stage type ・Standalone, controllable via API

  • Product

    Optical automatic surface inspection system ARGOS matrix

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1 Models of Optical automatic surface inspection system ARGOS matrix

Image Part Number Price (excluding tax)
Optical automatic surface inspection system ARGOS matrix-Part Number-ARGOS matrix

ARGOS matrix

Available upon quote

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About Company Handling This Product

Optoscience Co., Ltd.

Response Rate

100.0%

Response Time

14.1hrs

  • Japan

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Semiconductor inspection equipment
Semiconductor inspection equipment　Optoscience Co., Ltd.
Optoscience Co., Ltd.

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