CF5604-01 | 3.8φ and 5.6φCAN for each lineup semiconductor laser device hold sample
System Giken Co., Ltd.

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CF5604-01

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3.8φ and 5.6φCAN for each lineup semiconductor laser device hold sample

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System Giken Co., Ltd.

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3.8φ and 5.6φCAN for each lineup semiconductor laser device hold sample CF5604-01's performance table

Image	Price (excluding tax)	Instruction loss	Return loss	subject
	Available upon quote	10MHz ~ 10GHz: -7.925 ± 1.5db or less 10MHz ~ 16GHz: -7.925 ± 2.5db or less	10MHz ~ 10GHz: -15db or less (due to VNA's Gathing function) 10MHz ~ 16GHz: -8db or less (due to VNA's Gathing function)	5.6φ differential input

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System Giken Co., Ltd.

Japan

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CF5604-01 | 3.8φ and 5.6φCAN for each lineup semiconductor laser device hold sample System Giken Co., Ltd.

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3.8φ and 5.6φCAN for each lineup semiconductor laser device hold sample CF5604-01's performance table

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CF5604-01 | 3.8φ and 5.6φCAN for each lineup semiconductor laser device hold sample
System Giken Co., Ltd.