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  4. Bruker Corporation

Bruker Corporation's X-ray Inspection System

Bruker Corporation

2 products found

XRD device QC3 / QC-Velox for production control of compound semiconductor composition and film thickness-Bruker Corporation

Bruker Corporation

XRD device QC3 / QC-Velox for production control of compound semiconductor composition and film thickness

360+ people viewing

Last viewed: 1 day ago

Standard Response

Response Rate
100.0 %
Response Time
24.5 hours

■XRD equipment for quality control of compound semiconductors The Bruker QC3/QC-Velox instrument is designed specifically as an industrial XRD inst...


Automatic detection of notch and bevel defects X-ray topography equipment JV SENSUS-Bruker Corporation

Bruker Corporation

Automatic detection of notch and bevel defects X-ray topography equipment JV SENSUS

320+ people viewing

Standard Response

Response Rate
100.0 %
Response Time
24.5 hours

■X-ray topography equipment that automatically detects notch and bevel defects Bruker JV Sensus is a fab X-ray topography system. With the recent i...



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