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  4. Nidek Advanced Technology Co., Ltd.

Nidek Advanced Technology Co., Ltd.'s Semiconductor inspection equipment

Nidek Advanced Technology Co., Ltd.

5 products found

2D/3D inspection equipment for high-density substrates RSH Series RSH-12-Nidek Advanced Technology Co., Ltd.

Nidek Advanced Technology Co., Ltd.

2D/3D inspection equipment for high-density substrates RSH Series RSH-12

500+ people viewing

Last viewed: 3 hours ago

■Features ・Ultra high speed and high precision inspection ・2D/3D simultaneous measurement system ・Supports finer bump diameter/pitch


2D/3D inspection equipment for high-density substrates RSH Series RSH-23-Nidek Advanced Technology Co., Ltd.

Nidek Advanced Technology Co., Ltd.

2D/3D inspection equipment for high-density substrates RSH Series RSH-23

590+ people viewing

Last viewed: 1 day ago

■Features ・Ultra high speed and high precision inspection ・2D/3D simultaneous measurement system ・Supports finer bump diameter/pitch


2D/3D inspection equipment for high-density substrates RSH Series RSH-4-Nidek Advanced Technology Co., Ltd.

Nidek Advanced Technology Co., Ltd.

2D/3D inspection equipment for high-density substrates RSH Series RSH-4

460+ people viewing

Last viewed: 8 hours ago

■Features ・Ultra high speed and high precision inspection ・2D/3D simultaneous measurement system ・Supports finer bump diameter/pitch


Optical inspection equipment Optical automatic inspection equipment for semiconductor wafers RWi-300-Nidek Advanced Technology Co., Ltd.

Nidek Advanced Technology Co., Ltd.

Optical inspection equipment Optical automatic inspection equipment for semiconductor wafers RWi-300

530+ people viewing

Last viewed: 3 hours ago

Gold Bump Wafer Process 2D/3D Inspection System High-speed simultaneous height (3D) and appearance (2D) inspection ideal for mass-produced 100% in...


High-speed, high-precision 3D/2D/SD wafer bump automatic inspection system RWi-300MK3-Nidek Advanced Technology Co., Ltd.

Nidek Advanced Technology Co., Ltd.

High-speed, high-precision 3D/2D/SD wafer bump automatic inspection system RWi-300MK3

580+ people viewing

Last viewed: 2 hours ago

■Features ・Realizes simultaneous 3D/2D/SD measurement at high speed and with high accuracy ・Ideal for 3D inspection of gold bumps ・Various conve...



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