Irie Co., Ltd.'s Semiconductor inspection equipment
Irie Co., Ltd.2 products found
Irie Co., Ltd.
Wafer surface inspection equipment WM-10
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Last viewed: 1 day ago
very fast response<
100.0% Response Rate
2.6hours Response Time
Wafer surface equipment WM-10 is suitable for 90-65nm process node, low price and high performance ■Features/Applications ・Achieves maximum detec...
Irie Co., Ltd.
Highly sensitive measurement of particles on non-patterned wafers Wafer surface inspection system WM-7S
70+ people viewing
Last viewed: 1 day ago
very fast response<
100.0% Response Rate
2.6hours Response Time
It is capable of detecting particles on the wafer surface with high sensitivity, and is essential for maintaining yields in semiconductor manufactu...
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