Nidek Advanced Technology Co., Ltd.'s Semiconductor Inspection Equipment

High speed and high precision - Rotary/INDEX table type OPEN/LEAK automatic single board inspection equipment Ideal for high-speed inspection of B...

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• Semiconductor Inspection Equipment

Multi-sided CSP board continuity/short circuit (insulation) inspection system Achieves ultra-high-speed inspection of 0.6sec/piece. Introducing hi...

• Testing Equipment

• Semiconductor Inspection Equipment

High-speed, high-precision shuttle type step & repeat type OPEN/LEAK automatic board inspection equipment Ideal for testing continuity and short c...

• Testing Equipment

• Semiconductor Inspection Equipment

High-speed, high-precision shuttle type step & repeat type OPEN/LEAK automatic board inspection equipment Ideal for pattern continuity/short circu...

• Testing Equipment

• Semiconductor Inspection Equipment

■Features ・FC-CSP/High-precision inspection equipment for large individual boards ・Supports large and multi-pin boards such as chiplets ・Double ...

• Testing Equipment

• Semiconductor Inspection Equipment

■Features ・FC-CSP/High-precision inspection equipment for large individual boards ・Supports large and multi-pin boards such as chiplets ・Double ...

• Testing Equipment

• Semiconductor Inspection Equipment

■Features ・High-precision inspection equipment for large individual pieces/quarter panels ・Supports large and multi-pin boards such as chiplets ...

• Testing Equipment

• Semiconductor Inspection Equipment

High speed and high precision - upper/lower dual shuttle type step & repeat type OPEN/LEAK automatic panel board inspection equipment Efficiently ...

• Testing Equipment

• Semiconductor Inspection Equipment

■Features ・High-precision inspection equipment for half/quarter panels ・Supports large and multi-pin boards such as chiplets ・Supports various a...

• Testing Equipment

• Semiconductor Inspection Equipment

■Automotive power semiconductor (IGBT, SiC) module insulation static characteristic dynamic characteristic testing equipment The NATS-1000 is chara...

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• Semiconductor Inspection Equipment

Wide bandgap measurement technology. Insulation and static property inspection equipment can also be constructed. ■Data traceability Can be linked...

• Testing Equipment

• Semiconductor Inspection Equipment

Wide bandgap measurement technology. Insulation and static property inspection equipment can also be constructed. ■Data traceability Can be linked...

• Testing Equipment

• Semiconductor Inspection Equipment

Can inspect all products such as thin film RF filters, automotive DC modules, acceleration sensors, and MEMS devices. ■Features ・Ultra high insul...

• Testing Equipment

• Semiconductor Inspection Equipment