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HiSOL,Inc.'s Semiconductor Inspection Equipment

HiSOL,Inc.

2 products found

Standard semi-automatic prober HSP-200 (8 inch)-HiSOL,Inc.

HiSOL,Inc.

Standard semi-automatic prober HSP-200 (8 inch)

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Last viewed: 11 hours ago

The HSP-200 semi-automatic prober is a standard type semi-automatic probe system that can measure up to 8 inches (200 mm) wafers. It features a mec...


Brightlight wafer surface inspection equipment V2000-HiSOL,Inc.

HiSOL,Inc.

Brightlight wafer surface inspection equipment V2000

780+ people viewing

Last viewed: 6 hours ago

The V2000 Brightlight system is easy to use and efficient to inspect various types of defects on wafer surfaces. The system can be operated automat...



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