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  4. HiSOL,Inc.

HiSOL,Inc.'s Semiconductor Inspection Equipment

HiSOL,Inc.

2 products found

Standard semi-automatic prober HSP-200 (8 inch)-HiSOL,Inc.

HiSOL,Inc.

Standard semi-automatic prober HSP-200 (8 inch)

160+ people viewing

Last viewed: 1 day ago

Standard Response

Response Rate
100.0 %
Response Time
28.6 hours

The HSP-200 semi-automatic prober is a standard type semi-automatic probe system that can measure up to 8 inches (200 mm) wafers. It features a mec...


Brightlight wafer surface inspection equipment V2000-HiSOL,Inc.

HiSOL,Inc.

Brightlight wafer surface inspection equipment V2000

220+ people viewing

Standard Response

Response Rate
100.0 %
Response Time
28.6 hours

The V2000 Brightlight system is easy to use and efficient to inspect various types of defects on wafer surfaces. The system can be operated automat...



Check the product list of HiSOL,Inc.

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