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Bruker Corporation
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Last viewed: 7 hours ago
■XRD equipment for quality control of compound semiconductors The Bruker QC3/QC-Velox instrument is designed specifically as an industrial XRD inst...
Bruker Corporation
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■X-ray topography equipment that automatically detects notch and bevel defects Bruker JV Sensus is a fab X-ray topography system. With the recent i...
Bruker Corporation
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Last viewed: 1 day ago
■High-speed XRP&XRF measurement for metal film thickness and composition evaluation of patterned wafers The Bruker Sirius RF-T is the successor to ...