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Bruker Corporation's Semiconductor Inspection Equipment

Bruker Corporation

3 products found

XRD device QC3 / QC-Velox for production control of compound semiconductor composition and film thickness-Bruker Corporation

Bruker Corporation

XRD device QC3 / QC-Velox for production control of compound semiconductor composition and film thickness

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Last viewed: 5 hours ago

■XRD equipment for quality control of compound semiconductors The Bruker QC3/QC-Velox instrument is designed specifically as an industrial XRD inst...


Automatic detection of notch and bevel defects X-ray topography equipment JV SENSUS-Bruker Corporation

Bruker Corporation

Automatic detection of notch and bevel defects X-ray topography equipment JV SENSUS

400+ people viewing

Last viewed: 6 hours ago

■X-ray topography equipment that automatically detects notch and bevel defects Bruker JV Sensus is a fab X-ray topography system. With the recent i...


Sirius RF-T, high-speed XRR & XRF measurement device for evaluating metal film thickness and composition of patterned wafers-Bruker Corporation

Bruker Corporation

Sirius RF-T, high-speed XRR & XRF measurement device for evaluating metal film thickness and composition of patterned wafers

400+ people viewing

Last viewed: 6 hours ago

■High-speed XRP&XRF measurement for metal film thickness and composition evaluation of patterned wafers The Bruker Sirius RF-T is the successor to ...



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