HiSOL,Inc.'s Probers

11 products found

HiSOL,Inc.

Semi-automatic prober for small diameter wafers HSP-100 (4 inch)

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Last viewed: 22 hours ago

The HSP-100 and HSP-150 semi-automatic probe systems are standard semi-automatic probe systems that can measure small diameter wafers up to 4 inche...

HiSOL,Inc.

Compact high and low temperature semi-automatic prober HSP-100SC (4 inch)

210+ people viewing

The HSP-100SC/HSP-150SC semi-automatic prober is a semi-automatic probe system with a sealed chamber that can measure up to 4 inches (100mm) or up ...

HiSOL,Inc.

Semi-automatic prober for small diameter wafers HSP-150 (6 inch)

220+ people viewing

Last viewed: 1 day ago

The HSP-100 and HSP-150 semi-automatic probe systems are standard semi-automatic probe systems that can measure small diameter wafers up to 4 inche...

HiSOL,Inc.

Double-sided semi-automatic prober HSP-150DS (6 inch)

200+ people viewing

We offer custom double-sided semi-automatic probe systems that allow access to both the front and back sides of the wafer. It can be used for evalu...

HiSOL,Inc.

Compact high and low temperature semi-automatic prober HSP-150SC (6 inch)

220+ people viewing

The HSP-100SC/HSP-150SC semi-automatic prober is a semi-automatic probe system with a sealed chamber that can measure up to 4 inches (100mm) or up ...

HiSOL,Inc.

Standard semi-automatic prober HSP-200 (8 inch)

200+ people viewing

The HSP-200 semi-automatic prober is a standard type semi-automatic probe system that can measure up to 8 inches (200 mm) wafers. It features a mec...

HiSOL,Inc.

Double-sided semi-automatic prober HSP-200DS (8 inch)

240+ people viewing

We offer custom double-sided semi-automatic probe systems that allow access to both the front and back sides of the wafer. It can be used for evalu...

HiSOL,Inc.

Semi-automatic prober for high and low temperatures HSP-200SC (8 inch)

270+ people viewing

The HSP-200SC/HSP-300SC semi-automatic prober is a semi-automatic probe system compatible with next-generation semiconductor devices that pursues l...

HiSOL,Inc.

Standard semi-automatic prober HSP-300 (12 inch)

210+ people viewing

Last viewed: 7 hours ago

The HSP-300 semi-automatic prober is a standard semi-automatic probe system that can measure up to 12 inches (300mm) wafers. It features a mechanic...

HiSOL,Inc.

Semi-automatic prober for high and low temperatures HSP-300SC (12 inch)

210+ people viewing

Last viewed: 1 day ago

The HSP-200SC/HSP-300SC semi-automatic prober is a semi-automatic probe system compatible with next-generation semiconductor devices that pursues l...

HiSOL,Inc.

Failure analysis device Nanoprobe

140+ people viewing

Nanoprobing is essential for failure analysis of semiconductors, which are becoming increasingly finer each year, so probes for nanoprobers must al...

Check the product list of HiSOL,Inc.

HiSOL,Inc.'s Probers

Semi-automatic prober for small diameter wafers HSP-100 (4 inch)

Compact high and low temperature semi-automatic prober HSP-100SC (4 inch)

Semi-automatic prober for small diameter wafers HSP-150 (6 inch)

Double-sided semi-automatic prober HSP-150DS (6 inch)

Compact high and low temperature semi-automatic prober HSP-150SC (6 inch)

Standard semi-automatic prober HSP-200 (8 inch)

Double-sided semi-automatic prober HSP-200DS (8 inch)

Semi-automatic prober for high and low temperatures HSP-200SC (8 inch)

Standard semi-automatic prober HSP-300 (12 inch)

Semi-automatic prober for high and low temperatures HSP-300SC (12 inch)

Failure analysis device Nanoprobe

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