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11 products found
HiSOL,Inc.
230+ people viewing
Last viewed: 10 hours ago
The HSP-100 and HSP-150 semi-automatic probe systems are standard semi-automatic probe systems that can measure small diameter wafers up to 4 inche...
HiSOL,Inc.
190+ people viewing
Last viewed: 10 hours ago
The HSP-100SC/HSP-150SC semi-automatic prober is a semi-automatic probe system with a sealed chamber that can measure up to 4 inches (100mm) or up ...
HiSOL,Inc.
200+ people viewing
Last viewed: 10 hours ago
The HSP-100 and HSP-150 semi-automatic probe systems are standard semi-automatic probe systems that can measure small diameter wafers up to 4 inche...
HiSOL,Inc.
190+ people viewing
Last viewed: 10 hours ago
We offer custom double-sided semi-automatic probe systems that allow access to both the front and back sides of the wafer. It can be used for evalu...
HiSOL,Inc.
200+ people viewing
Last viewed: 10 hours ago
The HSP-100SC/HSP-150SC semi-automatic prober is a semi-automatic probe system with a sealed chamber that can measure up to 4 inches (100mm) or up ...
HiSOL,Inc.
180+ people viewing
Last viewed: 10 hours ago
The HSP-200 semi-automatic prober is a standard type semi-automatic probe system that can measure up to 8 inches (200 mm) wafers. It features a mec...
HiSOL,Inc.
230+ people viewing
Last viewed: 10 hours ago
We offer custom double-sided semi-automatic probe systems that allow access to both the front and back sides of the wafer. It can be used for evalu...
HiSOL,Inc.
260+ people viewing
Last viewed: 2 hours ago
The HSP-200SC/HSP-300SC semi-automatic prober is a semi-automatic probe system compatible with next-generation semiconductor devices that pursues l...
HiSOL,Inc.
190+ people viewing
Last viewed: 2 hours ago
The HSP-300 semi-automatic prober is a standard semi-automatic probe system that can measure up to 12 inches (300mm) wafers. It features a mechanic...
HiSOL,Inc.
200+ people viewing
Last viewed: 10 hours ago
The HSP-200SC/HSP-300SC semi-automatic prober is a semi-automatic probe system compatible with next-generation semiconductor devices that pursues l...
HiSOL,Inc.
130+ people viewing
Nanoprobing is essential for failure analysis of semiconductors, which are becoming increasingly finer each year, so probes for nanoprobers must al...
