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HiSOL,Inc.'s Probers

HiSOL,Inc.

11 products found

Semi-automatic prober for small diameter wafers HSP-100 (4 inch)-HiSOL,Inc.

HiSOL,Inc.

Semi-automatic prober for small diameter wafers HSP-100 (4 inch)

190+ people viewing

Last viewed: 2 hours ago

Standard Response

Response Rate
100.0 %
Response Time
27.0 hours

The HSP-100 and HSP-150 semi-automatic probe systems are standard semi-automatic probe systems that can measure small diameter wafers up to 4 inche...


Compact high and low temperature semi-automatic prober HSP-100SC (4 inch)-HiSOL,Inc.

HiSOL,Inc.

Compact high and low temperature semi-automatic prober HSP-100SC (4 inch)

160+ people viewing

Last viewed: 1 day ago

Standard Response

Response Rate
100.0 %
Response Time
27.0 hours

The HSP-100SC/HSP-150SC semi-automatic prober is a semi-automatic probe system with a sealed chamber that can measure up to 4 inches (100mm) or up ...


Semi-automatic prober for small diameter wafers HSP-150 (6 inch)-HiSOL,Inc.

HiSOL,Inc.

Semi-automatic prober for small diameter wafers HSP-150 (6 inch)

170+ people viewing

Last viewed: 1 day ago

Standard Response

Response Rate
100.0 %
Response Time
27.0 hours

The HSP-100 and HSP-150 semi-automatic probe systems are standard semi-automatic probe systems that can measure small diameter wafers up to 4 inche...


Double-sided semi-automatic prober HSP-150DS (6 inch)-HiSOL,Inc.

HiSOL,Inc.

Double-sided semi-automatic prober HSP-150DS (6 inch)

160+ people viewing

Last viewed: 16 hours ago

Standard Response

Response Rate
100.0 %
Response Time
27.0 hours

We offer custom double-sided semi-automatic probe systems that allow access to both the front and back sides of the wafer. It can be used for evalu...


Compact high and low temperature semi-automatic prober HSP-150SC (6 inch)-HiSOL,Inc.

HiSOL,Inc.

Compact high and low temperature semi-automatic prober HSP-150SC (6 inch)

170+ people viewing

Standard Response

Response Rate
100.0 %
Response Time
27.0 hours

The HSP-100SC/HSP-150SC semi-automatic prober is a semi-automatic probe system with a sealed chamber that can measure up to 4 inches (100mm) or up ...


Standard semi-automatic prober HSP-200 (8 inch)-HiSOL,Inc.

HiSOL,Inc.

Standard semi-automatic prober HSP-200 (8 inch)

160+ people viewing

Last viewed: 15 hours ago

Standard Response

Response Rate
100.0 %
Response Time
27.0 hours

The HSP-200 semi-automatic prober is a standard type semi-automatic probe system that can measure up to 8 inches (200 mm) wafers. It features a mec...


Double-sided semi-automatic prober HSP-200DS (8 inch)-HiSOL,Inc.

HiSOL,Inc.

Double-sided semi-automatic prober HSP-200DS (8 inch)

190+ people viewing

Last viewed: 17 hours ago

Standard Response

Response Rate
100.0 %
Response Time
27.0 hours

We offer custom double-sided semi-automatic probe systems that allow access to both the front and back sides of the wafer. It can be used for evalu...


Semi-automatic prober for high and low temperatures HSP-200SC (8 inch)-HiSOL,Inc.

HiSOL,Inc.

Semi-automatic prober for high and low temperatures HSP-200SC (8 inch)

220+ people viewing

Last viewed: 1 day ago

Standard Response

Response Rate
100.0 %
Response Time
27.0 hours

The HSP-200SC/HSP-300SC semi-automatic prober is a semi-automatic probe system compatible with next-generation semiconductor devices that pursues l...


Standard semi-automatic prober HSP-300 (12 inch)-HiSOL,Inc.

HiSOL,Inc.

Standard semi-automatic prober HSP-300 (12 inch)

160+ people viewing

Standard Response

Response Rate
100.0 %
Response Time
27.0 hours

The HSP-300 semi-automatic prober is a standard semi-automatic probe system that can measure up to 12 inches (300mm) wafers. It features a mechanic...


Semi-automatic prober for high and low temperatures HSP-300SC (12 inch)-HiSOL,Inc.

HiSOL,Inc.

Semi-automatic prober for high and low temperatures HSP-300SC (12 inch)

170+ people viewing

Last viewed: 7 hours ago

Standard Response

Response Rate
100.0 %
Response Time
27.0 hours

The HSP-200SC/HSP-300SC semi-automatic prober is a semi-automatic probe system compatible with next-generation semiconductor devices that pursues l...


HiSOL,Inc.

Failure analysis device Nanoprobe

120+ people viewing

Standard Response

Response Rate
100.0 %
Response Time
27.0 hours

Nanoprobing is essential for failure analysis of semiconductors, which are becoming increasingly finer each year, so probes for nanoprobers must al...



Check the product list of HiSOL,Inc.

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