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Park Systems Japan Co., Ltd.'s Surface Inspection Systems

Park Systems Japan Co., Ltd.

1 product found

Surface Inspection Metrology of Nanofilms (SIMON)-Park Systems Japan Co., Ltd.

Park Systems Japan Co., Ltd.

Surface Inspection Metrology of Nanofilms (SIMON)

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SIMON is specially designed for regular measurement tasks in imaging ellipsometry. The simple user interface and robustness of the fixed-angle ell...



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