Optical inspection equipment Total luminous flux measurement system
ND Seiko Co., Ltd.
About This Product
Measures chromaticity, total luminous flux, etc. of light sources such as LED lighting, LED backlights, organic LEDs, UV LEDs, etc. with simple operation and high accuracy.
■Summary
The total luminous flux measurement system can measure light sources with 2π and 4π light distributions that comply with LM-78 and LM-79 established by the LED lighting measurement standard IESNA (Illuminating Engineers of North America). In addition, as a calibration function, self-absorption correction and spectral sensitivity calibration are possible using a measurement method compliant with JIS C8152.
■Features
- Selectable integrating sphere size (from 2 inches to 3 m)
・Enables long-term stable measurement due to highly weather resistant material on the inner surface of the integrating sphere
・Light source measurement up to 100,000lm possible
・Satellite type integrating sphere can be installed in the measurement port
・Detector can be selected from highly sensitive cooled BT-CCD and high D range type NMOS
・Support jigs and sockets available for various light sources
・Standard LED compatible holder can be installed
・Measure the total luminous flux by automatically controlling the light source lighting power supply, wattmeter, and spectrometer
・Equipped with self-absorption correction function using self-absorption lamp
・Equipped with wavelength axis calibration function and spectral sensitivity calibration function
・Dedicated software in Japanese, English, and Chinese versions is included as standard.
■Basic configuration
・Integrating sphere
・Spectrometry device
・NIST compliant calibration light source
・Self-absorption correction lamp
・Low pressure mercury lamp
・DC power supply (AC power supply or wattmeter if necessary)
・Dedicated software
■Measurement items
・Total luminous flux (LF[lm])
・Radiant flux (RF[W])
・Luminous efficiency (LE[lm/W])
・Chromaticity (CIEx,y) , (CIEu,v) , (CIEu’,v’)
・Correlated color temperature (Tcp[K])
・Blackbody radiation locus deviation (Duv)
・Color rendering index (CRI)
・Spectral radiant intensity spectrum ([W/nm])
・Information on dominant wavelength and each peak (half width), etc.
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Product
Optical inspection equipment Total luminous flux measurement system
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Handling Company
ND Seiko Co., Ltd.
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Categories
1 Models of Optical inspection equipment Total luminous flux measurement system
| Product Image | Part Number | Price (excluding tax) |
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Total luminous flux measurement system |
Available upon quote |
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About Company Handling This Product
- Japan