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  4. Optical inspection equipment Total luminous flux measurement system (ND Seiko Co., Ltd.)
Optical inspection equipment Total luminous flux measurement system-Total luminous flux measurement system
Optical inspection equipment Total luminous flux measurement system-ND Seiko Co., Ltd.

Optical inspection equipment Total luminous flux measurement system
ND Seiko Co., Ltd.

ND Seiko Co., Ltd.'s Response Status

Response Rate

100.0%

Response Time

46.6hours

About This Product

Measures chromaticity, total luminous flux, etc. of light sources such as LED lighting, LED backlights, organic LEDs, UV LEDs, etc. with simple operation and high accuracy.

■Summary

The total luminous flux measurement system can measure light sources with 2π and 4π light distributions that comply with LM-78 and LM-79 established by the LED lighting measurement standard IESNA (Illuminating Engineers of North America). In addition, as a calibration function, self-absorption correction and spectral sensitivity calibration are possible using a measurement method compliant with JIS C8152.

■Features

- Selectable integrating sphere size (from 2 inches to 3 m) ・Enables long-term stable measurement due to highly weather resistant material on the inner surface of the integrating sphere ・Light source measurement up to 100,000lm possible ・Satellite type integrating sphere can be installed in the measurement port ・Detector can be selected from highly sensitive cooled BT-CCD and high D range type NMOS ・Support jigs and sockets available for various light sources ・Standard LED compatible holder can be installed ・Measure the total luminous flux by automatically controlling the light source lighting power supply, wattmeter, and spectrometer ・Equipped with self-absorption correction function using self-absorption lamp ・Equipped with wavelength axis calibration function and spectral sensitivity calibration function ・Dedicated software in Japanese, English, and Chinese versions is included as standard.

■Basic configuration

・Integrating sphere ・Spectrometry device ・NIST compliant calibration light source ・Self-absorption correction lamp ・Low pressure mercury lamp ・DC power supply (AC power supply or wattmeter if necessary) ・Dedicated software

■Measurement items

・Total luminous flux (LF[lm]) ・Radiant flux (RF[W]) ・Luminous efficiency (LE[lm/W]) ・Chromaticity (CIEx,y) , (CIEu,v) , (CIEu’,v’) ・Correlated color temperature (Tcp[K]) ・Blackbody radiation locus deviation (Duv) ・Color rendering index (CRI) ・Spectral radiant intensity spectrum ([W/nm]) ・Information on dominant wavelength and each peak (half width), etc.

  • Product

    Optical inspection equipment Total luminous flux measurement system

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1 Models of Optical inspection equipment Total luminous flux measurement system

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Optical inspection equipment Total luminous flux measurement system-Part Number-Total luminous flux measurement system

Total luminous flux measurement system

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About Company Handling This Product

ND Seiko Co., Ltd.

Response Rate

100.0%

Response Time

46.6hrs

  • Japan

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