Nanoscale infrared spectrometer Park NX-IR for chemical analysis and materials imaging
Park Systems Japan Co., Ltd.
About This Product
The Park NX-IR is a combination of a nanoscale infrared (IR) spectrometer and an atomic force microscope (AFM) for chemical and materials characterization.
The Park NX-IR combines Park's industry-leading AFM technology with Molecular Vista's latest infrared spectroscopy technology, Photoinduced Force Microscopy (PiFM). PiFM infrared spectroscopy uses a non-contact technique with higher spatial resolution, higher measurement reliability, and superior resistance to sample damage than existing spectroscopic techniques, including tapping PTIR (Photothermal Induced Resonance). The PiFM installed in Park NX-IR is capable of high-resolution IR spectrum analysis and imaging of IR-absorbing materials, allowing accurate chemical composition measurements.
High-resolution IR spectra and traditional FTIR (Fourier Transform Infrared Spectroscopy) are closely correlated with each other. In addition, Park NX-IR is capable of detecting depth material composition information through variations in detection technology: direct drive and sideband bimodal detection.
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Product
Nanoscale infrared spectrometer Park NX-IR for chemical analysis and materials imaging
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Handling Company
Park Systems Japan Co., Ltd.
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Categories
1 Models of Nanoscale infrared spectrometer Park NX-IR for chemical analysis and materials imaging
| Product Image | Part Number | Price (excluding tax) |
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NX-IR |
Available upon quote |
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