All Categories

History

  1. Metoree
  2. Observation Equipment
  3. Atomic Force Microscopes
  4. Nanoscale infrared spectroscopy system (Bruker Corporation)
Nanoscale infrared spectroscopy system-Dimension IconIR
Nanoscale infrared spectroscopy system-Anasys nanoIR3
Nanoscale infrared spectroscopy system-Bruker Corporation

Nanoscale infrared spectroscopy system
Bruker Corporation

About This Product

■AFM infrared spectroscopy system The long-awaited new generation nanoscale infrared spectroscopy system Dimension IconIR

Dimension Icon is AFM's best-selling machine with the most installed records both domestically and internationally. Bruker's unique technology represented by PeakForce Tapping and nanoIR technology have finally been combined. In addition to well-established mechanical and electrical property technologies, infrared spectroscopy at the nanoscale is realized on a single system.

■Topography

・Peak Force Tapping ・Contact ・Tapping / FAST Tapping ・Force Curve / Force Volume

■Infrared spectroscopy

・Contact AFM-IR ・Resonance Enhanced AFM-IR ・Tapping AFM-IR ・Surface Sensitive AFM-IR

■Thermal analysis

・VITA/Nano-TA ・SThM ・TTM

■Mechanical property evaluation

・Peakforce QNM ・Phase, Friction ・Force spectroscopy ・Force Modulation ・Nano-Indentation ・Force Volume ・Contact Resonance Mapping ・AFM nano-DMA ・Nanolithography & Nanomanipulation ・Ringing Mode

■Electrical property evaluation

・Liftmode & Darklift ・EFM ・KPFM (AM & FM), Peakforce KPFM ・C-AFM & DCUBE-CAFM ・TUNA & Peakforce TUNA & DCUBE-TUNA ・PFM & & DCUBE-PFM & DCUBE-CR-PFM & SS-PFM ・SCM & DCUBE-SCM ・SSRM & DCUBE-SSRM ・sMIM & Peakforce sMIM & DCUBE-SMIM ・MFM & Torsional Resonance MFM nanoIR and AFM, both proven technologies integrated into one system

■Features of IconIR

・Best spectral performance correlated with FTIR spectrum ・Chemical imaging with 10 nm spatial resolution ・Surface sensitivity that can detect even monomolecular films

  • Product

    Nanoscale infrared spectroscopy system

Share this product


220+ people viewing

Last viewed: 11 hours ago

Free
Get started with our free quotation service - no cost, no obligation.

No Phone Required
We respect your privacy. You can receive quotes without sharing your phone number.

4 Models of Nanoscale infrared spectroscopy system

Click on the part number for more information about each product

Image Part Number Price (excluding tax)
Nanoscale infrared spectroscopy system-Part Number-Dimension IconIR

Dimension IconIR

Available upon quote
Nanoscale infrared spectroscopy system-Part Number-Anasys nanoIR3

Anasys nanoIR3

Available upon quote
Nanoscale infrared spectroscopy system-Part Number-Anasys nanoIR3-s

Anasys nanoIR3-s

Available upon quote
Nanoscale infrared spectroscopy system-Part Number-Anasys nanoIR3-s Broadband

Anasys nanoIR3-s Broadband

Available upon quote

Click on the part number for more information about each product

Customers who viewed this product also viewed

Reviews shown here are reviews of companies.

Atomic force microscope (material AFM) large platform Dimension series-Bruker Corporation

Atomic force microscope (material AFM) large platform Dimension series

Bruker Corporation

5.0

170+ people viewing

Last viewed: 41 minutes ago

Response time: 33.51 hours

Atomic Force Microscopes

32 models listed

Park FX40 automated atomic force microscope equipped with next-generation new features-Park Systems Japan Co., Ltd.

Park FX40 automated atomic force microscope equipped with next-generation new features

Park Systems Japan Co., Ltd.

630+ people viewing

Response time: 38.85 hours

Atomic Force Microscopes

2 models listed

Atomic force microscope (material AFM) small platform-Bruker Corporation

Atomic force microscope (material AFM) small platform

Bruker Corporation

5.0

270+ people viewing

Last viewed: 4 minutes ago

Response time: 33.51 hours

Atomic Force Microscopes

9 models listed

The most accurate and easy-to-use atomic force microscope (AFM) Park NX10-Park Systems Japan Co., Ltd.

The most accurate and easy-to-use atomic force microscope (AFM) Park NX10

Park Systems Japan Co., Ltd.

1570+ people viewing

Last viewed: 1 hour ago

Response time: 38.85 hours

Atomic Force Microscopes

3 models listed

The most economical research grade AFM Park NX7 with flexible sample handling-Park Systems Japan Co., Ltd.

The most economical research grade AFM Park NX7 with flexible sample handling

Park Systems Japan Co., Ltd.

740+ people viewing

Last viewed: 10 hours ago

Response time: 38.85 hours

Atomic Force Microscopes

2 models listed

Bio AFM (Atomic Force Microscope) Automated Force Spectroscopy-Bruker Corporation

Bio AFM (Atomic Force Microscope) Automated Force Spectroscopy

Bruker Corporation

5.0

130+ people viewing

Response time: 33.51 hours

Atomic Force Microscopes

7 models listed

Park NX12 is a versatile microscopy platform for analytical chemists and public facilities.-Park Systems Japan Co., Ltd.

Park NX12 is a versatile microscopy platform for analytical chemists and public facilities.

Park Systems Japan Co., Ltd.

540+ people viewing

Last viewed: 21 hours ago

Response time: 38.85 hours

Atomic Force Microscopes
Bio AFM (atomic force microscope) optical tweezers-Bruker Corporation

Bio AFM (atomic force microscope) optical tweezers

Bruker Corporation

5.0

290+ people viewing

Last viewed: 6 hours ago

Response time: 33.51 hours

Atomic Force Microscopes

6 models listed

Automated nanometer measurement equipment for wafer measurement and analysis Park NX20 300mm-Park Systems Japan Co., Ltd.

Automated nanometer measurement equipment for wafer measurement and analysis Park NX20 300mm

Park Systems Japan Co., Ltd.

620+ people viewing

Last viewed: 4 hours ago

Response time: 38.85 hours

Atomic Force Microscopes
Specifying the sample observation location and positioning the cantilever is possible alpha300A–AFM atomic force microscope-Oxford Instruments Ltd.

Specifying the sample observation location and positioning the cantilever is possible alpha300A–AFM atomic force microscope

Oxford Instruments Ltd.

5.0

880+ people viewing

Last viewed: 1 hour ago

Response time: 22.27 hours

Atomic Force Microscopes

3 models listed

Park NX20 is the most advanced nano-shape measurement tool for failure analysis and research and development on large samples.-Park Systems Japan Co., Ltd.

Park NX20 is the most advanced nano-shape measurement tool for failure analysis and research and development on large samples.

Park Systems Japan Co., Ltd.

570+ people viewing

Response time: 38.85 hours

Atomic Force Microscopes
Significantly improve productivity with highly versatile AFM Park NX20 Lite-Park Systems Japan Co., Ltd.

Significantly improve productivity with highly versatile AFM Park NX20 Lite

Park Systems Japan Co., Ltd.

820+ people viewing

Last viewed: 3 hours ago

Response time: 38.85 hours

Atomic Force Microscopes

2 models listed

See More Atomic Force Microscopes Products

Other products of Bruker Corporation

Reviews shown here are reviews of companies.

Atomic force microscope (material AFM) large platform Dimension series-Bruker Corporation

Atomic force microscope (material AFM) large platform Dimension series

Bruker Corporation

5.0

170+ people viewing

Last viewed: 41 minutes ago

Response time: 33.51 hours

Coordinate Measuring Machines

32 models listed

Atomic force microscope (material AFM) small platform-Bruker Corporation

Atomic force microscope (material AFM) small platform

Bruker Corporation

5.0

270+ people viewing

Last viewed: 4 minutes ago

Response time: 33.51 hours

Scanning Probe Microscopes

9 models listed

Atomic force microscope (material AFM) options-Bruker Corporation

Atomic force microscope (material AFM) options

Bruker Corporation

5.0

180+ people viewing

Last viewed: 4 minutes ago

Response time: 33.51 hours

2 models listed

Bio AFM (Atomic Force Microscope) Automated Force Spectroscopy-Bruker Corporation

Bio AFM (Atomic Force Microscope) Automated Force Spectroscopy

Bruker Corporation

5.0

130+ people viewing

Response time: 33.51 hours

Atomic Force Microscopes

7 models listed

Bio AFM (atomic force microscope) optical tweezers-Bruker Corporation

Bio AFM (atomic force microscope) optical tweezers

Bruker Corporation

5.0

290+ people viewing

Last viewed: 6 hours ago

Response time: 33.51 hours

Scanning Probe Microscopes

6 models listed

AFM / SPM / nanoIR probe-Bruker Corporation

AFM / SPM / nanoIR probe

Bruker Corporation

5.0

130+ people viewing

Last viewed: 9 hours ago

Response time: 33.51 hours

6 models listed

Nanomechanical property evaluation system Platform type nanoindenter-Bruker Corporation

Nanomechanical property evaluation system Platform type nanoindenter

Bruker Corporation

5.0

180+ people viewing

Last viewed: 42 minutes ago

Response time: 33.51 hours

3 models listed

Electron microscope built-in nanoindentation system SEM/TEM in-situ nanoindenter-Bruker Corporation

Electron microscope built-in nanoindentation system SEM/TEM in-situ nanoindenter

Bruker Corporation

5.0

190+ people viewing

Response time: 33.51 hours

Transmission Electron Microscopes

4 models listed

Multifunctional friction and wear tester UMT TriboLab-Bruker Corporation

Multifunctional friction and wear tester UMT TriboLab

Bruker Corporation

5.0

880+ people viewing

Response time: 33.51 hours

Friction Testers

3 models listed

Contour SP, white light interference microscope compatible with large substrates-Bruker Corporation

Contour SP, white light interference microscope compatible with large substrates

Bruker Corporation

5.0

700+ people viewing

Last viewed: 21 hours ago

Response time: 33.51 hours

Microscopes

2 models listed

300mm compatible fully automatic white light interference microscope Contour GTX-ARM-Bruker Corporation

300mm compatible fully automatic white light interference microscope Contour GTX-ARM

Bruker Corporation

5.0

1050+ people viewing

Last viewed: 19 hours ago

Response time: 33.51 hours

Microscopes

2 models listed

General purpose stylus profiling system Dektak XT-Bruker Corporation

General purpose stylus profiling system Dektak XT

Bruker Corporation

5.0

240+ people viewing

Last viewed: 13 hours ago

Response time: 33.51 hours


View more products of Bruker Corporation

About Company Handling This Product

Bruker Corporation

Company Overview

Bruker, founded in 1960 and based in Billerica, Massachusetts, is a manufacturer and distributor of scientific...

See More

  • United States of America

Related search keywords

Atomic Force Microscopes
Atomic Force Microscopes　Bruker Corporation
Bruker Corporation

This is the version of our website addressed to speakers of English in the United States. If you are a resident of another country, please select the appropriate version of Metoree for your country in the drop-down menu.

Copyright © 2025 Metoree