This product is registered by Oxford Instruments Ltd..
About This Product
■Summary
・Ultim Max is the next generation silicon drift detector (SDD).
- Largest sensor size combined with Extreme electronics for unparalleled speed and sensitivity.
-Ultim Max's large SDD sensor can collect up to 17x more data simultaneously without sacrificing accuracy.
Whether you want to map a wider area, get better statistics at each data point, collect data faster, or investigate the smallest nanostructures, Ultim Max is the solution for X-ray analysis in an SEM. It's the ultimate solution.
- Built-in electric slide mechanism allows easy and quick insertion when needed, and can be stored when not in use.
Features
■Speed
The combination of Extreme electronics and the X4 pulse processor allows UltimMax to map samples at a count rate of 1,500,000 cps and accurately quantify composition at 400,000 cps.
■Sensitivity
Extreme electronics have very low noise, allowing accurate identification and characterization of X-ray lines up to 72eV.
■NanoAnalysis
Equipped with one of the largest sensors with guaranteed low energy resolution, Ultim Max is ideal for low voltage analysis, maximizing its analytical capabilities at the nanoscale.
■Live Chemical Imaging
Ultim Max's large sensor and high-throughput performance enable live chemical imaging for the first time in an electron microscope.
■Collect up to 17 times more data in the same amount of time
Ultim Max's large SDD sensor can collect up to 17x more data simultaneously without sacrificing accuracy. Whether you want to map larger areas, get better statistics on each data point, collect data faster, or investigate the smallest nanostructures, Ultim Max is the ultimate for X-ray analysis in SEM. This is the solution.
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