Equipment that breaks the optical diffraction limit alpha300S–SNOM scanning near-field optical microscope
Oxford Instruments Ltd.
About This Product
■A device that breaks the optical diffraction limit
The alpha300 S is a user-friendly instrument that combines confocal microscopy (CM), atomic force microscopy (AFM), and scanning near-field optical microscopy (SNOM) capabilities in one instrument. To switch between each function, simply turn the revolver and switch the objective lens. In addition, by using a holed SNOM cantilever using unique microprocess technology, optical resolution exceeding the optical diffraction limit can be obtained.
WITec's near-field optical microscope alpha300S uses a unique objective lens. SNOM and AFM can be used by attaching the objective lens to the revolver. The pre-mounted SNOM cantilever is magnetically attached to the arm, allowing simultaneous viewing of the cantilever and sample under an optical microscope. To align the cantilever, the mounting arm can be moved in the XYZ directions using piezoelectric inertial drive.
Movement can be done from the control software and can be easily done by following the guidance function. The objective lens not only focuses the laser that excites the near-field light, but also the laser for the optical lever of the cantilever is irradiated through the objective lens. The two laser systems are a stable optical system with low noise and good focusing performance without interfering with each other. The alpha300S can be used as an AFM using a regular AFM cantilever.
■Features
・Achieves spatial resolution (approximately 60 nm in the lateral direction) that breaks the optical diffraction limit
・Uses patented hole-equipped SNOM cantilever
・Observation in air and liquid
・Supports a wide range of AFM operating modes
・Non-destructive observation with no sample processing required
・Upgrade to Raman imaging possible
■SNOM mode
・Near-field optical microscopy (SNOM) modes: transmission, reflection, and collection modes
・Confocal microscopy (CM) mode:
・Transparent
・Reflection
・Fluorescence (optional) etc.
■Microscope
・Research grade optical microscope with 6-objective lens revolver
・Video system: Eyepiece color video camera
・White LED Keller lighting
・High-sensitivity monochrome video camera: downward observation of the sample and SNOM/AFM probe
・XY direction manual sample stage X,Y25mm
・Active vibration isolation table included
・Piezo scanning stage (scanning width 100x100x20μm) (options for other scanning widths available)
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Product
Equipment that breaks the optical diffraction limit alpha300S–SNOM scanning near-field optical microscope
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Handling Company
Oxford Instruments Ltd.
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Categories
1 Models of Equipment that breaks the optical diffraction limit alpha300S–SNOM scanning near-field optical microscope
| Product Image | Part Number | Price (excluding tax) | Computer, software | Sample size |
|---|---|---|---|---|
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Alpha300S–SNOM |
Available upon quote | Equipment control, data collection software, data analysis evaluation software | Length and width: 120mm, thickness: 25mm, thicker samples can be accommodated with an adapter |
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About Company Handling This Product
- Japan