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Mass spectrometer QMG250 PrismaPro® Quadrupole mass spectrometry residual gas analyzer-QMG250 F1
Mass spectrometer QMG250 PrismaPro® Quadrupole mass spectrometry residual gas analyzer-Fuji Inback Co., Ltd.

Mass spectrometer QMG250 PrismaPro® Quadrupole mass spectrometry residual gas analyzer
Fuji Inback Co., Ltd.


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■Summary

High sensitivity, best-in-class stability, and intelligent operation make PrismaPro® the ideal solution for gas analysis. PrismaPro® is the minimum configuration unit of a quadrupole mass spectrometer equipped with a thermionic impact (EI) ion source, and its modular structure allows you to select the configuration according to your needs, such as ion source, filament, mass range, etc. Therefore, it can be used for a variety of purposes, including industrial use, analysis, research and development, semiconductor manufacturing, and coating. Furthermore, when combined with Pfeiffer Vacuum's high-quality vacuum products such as vacuum pumps, vacuum gauges, and vacuum mechanism parts, it is an ideal solution for a wide range of applications, from quality assurance, leak detection, residual gas analysis, to complex quantitative analysis.

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    Mass spectrometer QMG250 PrismaPro® Quadrupole mass spectrometry residual gas analyzer

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1 Models of Mass spectrometer QMG250 PrismaPro® Quadrupole mass spectrometry residual gas analyzer

Image Part Number Price (excluding tax) Ar sensitivity, Faraday Interface Detector Peak ratio reproducibility Baking temperature, analysis tube Mass range Rod system (diameter/length) Supply voltage Resolution (10% peak height) Operating temperature, analysis tube Operating temperature, electronic control section Connection flange Minimum detection limit, Faraday Staying time Contribution to adjacent mass peak (40/41)
Mass spectrometer QMG250 PrismaPro® Quadrupole mass spectrometry residual gas analyzer-Part Number-QMG250 F1

QMG250 F1

Available upon quote

5・10⁶ A/Pa

Ethernet

Faraday (F)

±0.5%

300℃

1~100 amu

Diameter 6mm/125mm

100~240VAC, 50/60Hz

0.5~2.5amu

200℃ (maximum 150℃ during SEM operation)

5~50℃

DN40CF-F

4・10⁻¹¹ Pa

1ms~16s/amu

<10 ppm

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