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3D view & analysis software MEX for scanning electron microscope-Standard 32/64bit
3D view & analysis software MEX for scanning electron microscope-Solutions Systems Co., Ltd.

3D view & analysis software MEX for scanning electron microscope
Solutions Systems Co., Ltd.


About This Product

■ Characteristics

・ Create a 3D surface stereos (Digital Elevation Map) from SEM with a deep depth or an optical camera stereo or three images. ・ Easy and accurate automatic processing using SmartWindow even on manual Youth tricks ・ Various analysis options (ISO4287 compliant surface roughness, surface area, volume measurement, 2D measurement) ・ Observe DEM images from a free perspective using a free AL3D app ・ Create 3D images without inclination from the reflective electronic sensor in four directions (StillCreator) ・ Create a 3D object with 3D Printer ・ Obtained surface 3D image of Frasta analysis ・ Evaluation report of 3 -way image (Auto Calibration)

■ Version -up function from MEX4.0 to 5.1

・ Create a 3D surface stereos (Digital Elevation Map) from SEM with a deep depth or an optical camera stereo or three images. ・ Menu, comments, and help (English and German can be selected) ・ Added loupe observation, pseudo -color mapping and coordinate data display function to each analysis function ・ Added dimension box outline to DEM image ・ Added details parameter display in profile analysis ・ Added 2D filter and selection mode for regional analysis ・ 3D editing option support (partial cut function of DEM image)

  • Product

    3D view & analysis software MEX for scanning electron microscope

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2 Models of 3D view & analysis software MEX for scanning electron microscope

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Image Part Number Price (excluding tax)
3D view & analysis software MEX for scanning electron microscope-Part Number-Standard 32/64bit

Standard 32/64bit

Available upon quote
3D view & analysis software MEX for scanning electron microscope-Part Number-Professional 32/64bit

Professional 32/64bit

Available upon quote

Click on the part number for more information about each product

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