Desktop film thickness meter XUV
F.I. Tech Co., Ltd.
About This Product
■Features
Particularly suited for research and development due to low detection limits, high repeatable accuracy, and widely upgradable measurements
・Equipped with a vacuum chamber and high-performance silicon drift detector that can measure even light elements with high precision
・Automatic continuous testing possible with programmable X, Y, and Z axes
- Adjustable to the demands of different materials and measurement conditions with replaceable collimators and filters
Main uses
■Film thickness measurement
・Nm-level layer of light elements from sodium
・Aluminum and silicon layer
■Material analysis
・Determining the authenticity and origin of gemstones
・General material analysis and forensics
・High-resolution microanalysis
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Product
Desktop film thickness meter XUV
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Handling Company
F.I. Tech Co., Ltd.
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Categories
1 Models of Desktop film thickness meter XUV
| Product Image | Part Number | Price (excluding tax) | Measurement method |
|---|---|---|---|
|
|
XUV |
Available upon quote | Fluorescent x-ray |
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About Company Handling This Product
- Japan