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Desktop film thickness meter XUV-XUV
Desktop film thickness meter XUV-F.I. Tech Co., Ltd.

Desktop film thickness meter XUV
F.I. Tech Co., Ltd.


About This Product

■Features

Particularly suited for research and development due to low detection limits, high repeatable accuracy, and widely upgradable measurements ・Equipped with a vacuum chamber and high-performance silicon drift detector that can measure even light elements with high precision ・Automatic continuous testing possible with programmable X, Y, and Z axes - Adjustable to the demands of different materials and measurement conditions with replaceable collimators and filters Main uses

■Film thickness measurement

・Nm-level layer of light elements from sodium ・Aluminum and silicon layer

■Material analysis

・Determining the authenticity and origin of gemstones ・General material analysis and forensics ・High-resolution microanalysis

  • Product

    Desktop film thickness meter XUV

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1 Models of Desktop film thickness meter XUV

Image Part Number Price (excluding tax) Measurement method
Desktop film thickness meter XUV-Part Number-XUV

XUV

Available upon quote

Fluorescent x-ray

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