Large ellipsometer system
Optoscience Co., Ltd.
About This Product
Axometrics' ellipsometer system is capable of rapidly measuring the thickness, refractive index, anisotropy, and orientation of thin films on glass.
■Summary
The ellipsometer system equipped with AxoScan performs analysis after acquiring the complete Mueller matrix, making it possible to evaluate the properties of anisotropic thin films that were previously impossible. This system is constructed to comply with common customer factory specifications, including interlocking with external equipment. Compatible with mother glass from 4th generation to 8th generation.
■VVRM system
This is an ellipsometer system equipped with AxoScan that can measure the thickness of thin films on large glass substrates. Because AxoScan measures the complete Mueller matrix, the system is particularly suited for measuring anisotropic thin films, which are difficult to measure with traditional ellipsometers. It is particularly useful for measuring the alignment direction, relative anisotropy, thickness, and refractive index of rubbed or photo-aligned PI (polyimide) used as alignment layers in LCD panels.
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Product
Large ellipsometer system
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Handling Company
Optoscience Co., Ltd.
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Categories
1 Models of Large ellipsometer system
| Product Image | Part Number | Price (excluding tax) |
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Large ellipsometer system |
Available upon quote |
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About Company Handling This Product
- Japan