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  4. Large ellipsometer system (Optoscience Co., Ltd.)
Large ellipsometer system-Large ellipsometer system
Large ellipsometer system-Optoscience Co., Ltd.

Large ellipsometer system
Optoscience Co., Ltd.

Optoscience Co., Ltd.'s Response Status

Response Rate

100.0%

Response Time

14.1hours

Relatively Fast Response

About This Product

Axometrics' ellipsometer system is capable of rapidly measuring the thickness, refractive index, anisotropy, and orientation of thin films on glass.

■Summary

The ellipsometer system equipped with AxoScan performs analysis after acquiring the complete Mueller matrix, making it possible to evaluate the properties of anisotropic thin films that were previously impossible. This system is constructed to comply with common customer factory specifications, including interlocking with external equipment. Compatible with mother glass from 4th generation to 8th generation.

■VVRM system

This is an ellipsometer system equipped with AxoScan that can measure the thickness of thin films on large glass substrates. Because AxoScan measures the complete Mueller matrix, the system is particularly suited for measuring anisotropic thin films, which are difficult to measure with traditional ellipsometers. It is particularly useful for measuring the alignment direction, relative anisotropy, thickness, and refractive index of rubbed or photo-aligned PI (polyimide) used as alignment layers in LCD panels.

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    Large ellipsometer system

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1 Models of Large ellipsometer system

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Large ellipsometer system-Part Number-Large ellipsometer system

Large ellipsometer system

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About Company Handling This Product

Optoscience Co., Ltd.

Response Rate

100.0%

Response Time

14.1hrs

  • Japan

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Ellipsometers
Ellipsometers　Optoscience Co., Ltd.
Optoscience Co., Ltd.

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