Product
Laser diffraction type particle diameter measuring device Master Siza Series 3000Handling Company
SpectoryProduct Image | Part Number | Price (excluding tax) | Detector angle range | Detector optical axis adjustment | Detector placement | General analysis items | General data acquisition speed | General dimensions (W x d x h) | General particle size | General principle | General standard measurement time | General weight | Number of particle diameter measurement size classes | Optical -based effective focal length | Optical blue light source | Optical lens placement | Optical red light source | Particle diameter measurement accuracy | Particle diameter measurement accuracy/repetition | Particle diameter measurement reproducibility (at non -continuous measurement) | Particle diameter measuring particle size | Software 21 CFR Part 11 | System compliance laser safety | System compliance regulation test | System humidity | System operation temperature (° C) | System power supply | System product storage temperature | System protection grade (IP) | remarks* |
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Master Saizer 3000 |
Available upon quote | 0.015-144 ° | Automatic | Logarithmic interval sequence | MIE theory, FRAUNHOFER approximation | 10 KHz | 690mm x 300mm x 450mm | Suspension, emulsion, and dry powder | Laser diffraction type | Within 10 seconds | 30 kg | 100 (user adjustable) | 300mm | Up to 10MW LED, 470nm | Reverse Fourier optical system (convergence beam) | Up to 4MW HE-NE, 632.8nm | Within 0.6% ** | Within 0.5%* | Within 1% * | 0.01 to 3,500 µm * | Operating mode ER/ES compliant | Class 1, IEC60825-1: 2007 and CFR Chapter I: Sub-Chapterj: Part 1040 (CDRH) | Compatibility with the requirements for Rohs and WEEE compliant CE / FCC -compliant European low voltage commands | Up to 31 ° C is up to 80%. After that, there is no linear decrease to 50%to 40 ° C and no condensation | #ERROR! | 100/240 V, 50/60 Hz 50W (if the distributed unit is not connected) up to 200W (when 2 units are connected) | -20 ° C ~+50 ° C | IP41B | It depends on the type of sample and its adjustment. |