Spectrophotometer Infrared microscope/imaging system Spotlight 400/400N-Spotlight 400
Spectrophotometer Infrared microscope/imaging system Spotlight 400/400N-Meishin Koki Co., Ltd.

Spectrophotometer Infrared microscope/imaging system Spotlight 400/400N
Meishin Koki Co., Ltd.


About This Product

■Summary Analyze “faster and easier”. Achieves high throughput with dual view technology, simultaneous measurement of all elements, and reduced daily maintenance Features ■Realizes ultra-high-speed IR imaging Imaging area can be freely changed ・SynchroScan interferometer synchronization system (patented technology) that synchronizes the automatic stage of an infrared microscope and linear MCT array detector for the first time in the world ・When the interferometer acquires a spectrum and returns to its initial position, the motorized stage moves at high speed in synchronization with the movement of the interferometer. ■Compatible with imaging and micro IR measurement ・The patented Duet™ detector consists of a linear array element and a single element arranged in the same plane and assembled into a dewar. ・In addition to imaging and transmission/reflection measurements, microscopic ATR measurements are also possible without switching detectors. ・Guarantees optimal performance for various applications ■Detector pixel size can be selected from 1.56 µm (ATR), 6.25 µm, 25 µm, and 50 µm. Software control allows you to adjust the magnification to the detection element and specify the spatial resolution. No need for troublesome parts replacement ■ATR imaging compatible ・Standard crystal supports wide area measurement up to 400 µm x 400 µm ・Large type can measure a wide range from 750 µm × 750 µm to 400 µm × 1,000 µm ■Imaging measurement possible down to low wave numbers Up to 650 cm-1 standard, plus industry-only wideband array (~580 cm-1) and InGaAs detector options (optional) [Example of low wave number detection band: analysis band] ・Substitution position of benzene ring: 900 – 650 cm-1 ・Polypropylene – Copolymer: 800 – 700 cm-1 ・Qualitative properties of vinyl chloride (C-Cl): 700 – 600 cm-1 ・Carbon in Si wafer: 600 cm-1

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    Spectrophotometer Infrared microscope/imaging system Spotlight 400/400N

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1 Models of Spectrophotometer Infrared microscope/imaging system Spotlight 400/400N

Product Image Part Number Price (excluding tax) ATR imaging area ATR imaging pixel size Auto ATR Auto control Imaging area Imaging measurement mode Imaging measurement wavenumber range Imaging pixel size Micro ATR Point measurement SN ratio Point measurement mode Point measurement wave number range Size (W × H × D) Stage Stage size Visible light source Visible observation Weight
Spectrophotometer Infrared microscope/imaging system Spotlight 400/400N-Part Number-Spotlight 400

Spotlight 400

Available upon quote Up to 400 µm × 400 µm, 100 µm × 500 µm (standard crystal)
Up to 750 µm × 750 µm, 400 µm × 1,000 µm (large crystal)
6.25 µm × 6.25 µm, 1.56 µm × 1.56 µm Software controls crystal loading and unloading
Pressure monitor with software control
Line scan, mapping, XYZ stage,
autofocus, autocorrection, aperture,
Transmission/reflection switching, infrared/visible switching, illumination brightness
100 µm × 100 µm ~ 50 mm × 50 mm arbitrarily variable Transmission / Reflection / ATR 7,800–650cm-1 (transmission, reflection)
4,500–680cm-1 (ATR)
7,800–580cm-1 (broadband MCT)
7,800–4,000cm-1 (InGaAS)
50 µm × 50 µm, 25 µm × 25 µm, 6.25 µm × 6.25 µm 100 µmφ conical Ge crystal (standard)
100 µmφ conical Si crystal (optional)
100 µmφ conical DLC-Ge crystal (optional)
12,000: 1 (1 minute integration) Transmission / Reflection / ATR 7,800 – 600 cm-1 (MCT)
10,000 – 4,000 cm-1 (InGaAS)
Spotlight body: 340 x 470 x 570 mm
Spectrum 3 body: 520 × 300 × 600 mm
XYZ auto stage 75 × 50 mm (standard stage)
160 × 60 mm (large stage, optional)
White LED CCD camera Spotlight: 32Kg
Spectrum 3: 34Kg

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