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  4. Optical microscope Automated cleanliness inspection, counting and measurement of contamination and foreign objects Automatic contamination Cleanliness Expert (Meishin Koki Co., Ltd.)
Optical microscope Automated cleanliness inspection, counting and measurement of contamination and foreign objects Automatic contamination Cleanliness Expert-DM4 M
Optical microscope Automated cleanliness inspection, counting and measurement of contamination and foreign objects Automatic contamination Cleanliness Expert-Meishin Koki Co., Ltd.

Optical microscope Automated cleanliness inspection, counting and measurement of contamination and foreign objects Automatic contamination Cleanliness Expert
Meishin Koki Co., Ltd.

Meishin Koki Co., Ltd.'s Response Status

Response Rate

100.0%

Response Time

17.9hours

Company Review

5.0

Relatively Fast Response

About This Product

■Summary

Contamination (residual foreign matter) can be measured easily and with high accuracy. Features

■Easy, quick, and highly accurate measurement

A system that photographs fine particles (pollutants, contaminants) collected by membrane filters using a metallurgical microscope or digital microscope, detects contaminants, and automatically measures the type, size, and number of particles to evaluate cleanliness.

■Compatible with international and domestic standards

Compatible with international and domestic standards to meet analysis and classification needs for various objects ・ISO16232 ・German Automobile Industry Association standard VDA19 ・ISO4406 etc.

■Automatic contamination classification

・Automatically classifies contamination as reflective/non-reflective ・Evaluation of sources of contamination and possible potential risks

■Contamination confirmation editing function after measurement

・After measurement, the data is displayed in a list, and by simply clicking the measurement result of a specific contaminant with the mouse, the stage moves, allowing you to observe the foreign object in more detail. ・It is possible to delete items other than contamination and edit the results.

■Recommended for the following industries

Product functionality and service life are related to particle contamination, and quantitative detection is useful for improving manufacturing processes. ・Auto parts ・Electronic parts ・Secondary battery ・Conductive resin ·piston ·bearing ・Pharmaceutical industry, etc.

■Accurately without taking much time

Leica is the first company in the world to jointly develop automatic contamination inspection systems with several leading manufacturers in the automotive manufacturing field. By integrating a high-performance motorized microscope and software optimized for cleanliness inspection, we can easily and quickly measure particles using highly accurate microscopy. Leica Cleanliness Expert has been used in a wide range of industries, including the automotive industry, where high safety is required, as well as the materials/chemical industry, semiconductor industry, and electrical/electronic industry.

■Up to elemental analysis to identify the source of contamination

Equipped with the Leica LIBS module, after the Cleanliness Expert system classifies the particle shape and size of foreign particles, the target contaminants that meet the conditions (size, metal only, etc.) can be immediately analyzed using the LIBS analysis method. It is possible to analyze. ・No pre-processing required…No sample preparation such as vacuuming is required, and color information can be checked with good visibility while retaining color information. ・Quick result output...Compared to conventional SEM/EDX methods, anyone can obtain elemental analysis results in just a few seconds.

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    Optical microscope Automated cleanliness inspection, counting and measurement of contamination and foreign objects Automatic contamination Cleanliness Expert

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1 Models of Optical microscope Automated cleanliness inspection, counting and measurement of contamination and foreign objects Automatic contamination Cleanliness Expert

Image Part Number Price (excluding tax) Transmitted light Electric control Transmitted light observation method Transmitted light illumination Additional features Incident light electric control Epi-light observation method Epi-light illumination Automatic analysis Accuracy Movement range Foreign matter separation Eyepiece lens Wide range shooting Objective turret Report creation Control Reproducibility Magnification range User settings Focus Navigation standards Drive Imaging
Optical microscope Automated cleanliness inspection, counting and measurement of contamination and foreign objects Automatic contamination Cleanliness Expert-Part Number-DM4 M

DM4 M

Available upon quote

Contrast Manager: Light settings, brightness, and aperture automatically adjust according to mode
Illumination Manager: Brightness is always adjusted to the optimum level even if you change the observation method or magnification

BF (bright field), Pol (polarization), PH (phase contrast), DIC (differential interference)

High power LED

Rich software features for motorized microscope functions
Overview image acquisition, depth compositing, measurement, binarization
Software for metal analysis such as steel inclusion testing, grain size analysis, phase separation, etc.

Electric filter turret (4 pieces)
Contrast Manager: Light settings, brightness, and aperture automatically adjust according to mode
Illumination Manager: Brightness is always adjusted to the optimum level even if you change the observation method or magnification

BF (bright field), DF (dark field), Pol (polarization), DIC (differential interference interference), Fluo (fluorescence) *DF/DIC/Fluo are optional.

High power LED

Contamination editing: combination, separation Graph display: number distribution graph
Automatic measurement: Maximum length, area, number, reflection/non-reflection judgment
Length measurement: Manual length measurement/annotation of any contamination, simple height measurement

±3μm

75 x 50mm

Reflective (metal), non-reflective (non-metal), fiber (textile)

Can be

Scanning circular and rectangular areas

6 holes: Manual (coded) M32 for dark field
7 holes: Manual (coded) M25 for bright field

Excel, PDF, raw data


Control unit for x, y direction (stage) movement

<1μm

1.25x~150x objective lens

Administrator, operator

Manual, electric (Z-axis coupler specification)

Move from the measurement list to the counted foreign objects
ISO16232, VDA19, ISO4406, DIN51455, USP788, SAE AS4059, NAS1638, user settings

Spindle

Leica microscope digital camera

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About Company Handling This Product

Meishin Koki Co., Ltd.

Response Rate

100.0%

Response Time

17.9hrs

Company Review

5.0
  • Japan

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