Optical microscope Automated cleanliness inspection, counting and measurement of contamination and foreign objects Automatic contamination Cleanliness Expert
Meishin Koki Co., Ltd.
About This Product
■Summary
Contamination (residual foreign matter) can be measured easily and with high accuracy.
Features
■Easy, quick, and highly accurate measurement
A system that photographs fine particles (pollutants, contaminants) collected by membrane filters using a metallurgical microscope or digital microscope, detects contaminants, and automatically measures the type, size, and number of particles to evaluate cleanliness.
■Compatible with international and domestic standards
Compatible with international and domestic standards to meet analysis and classification needs for various objects
・ISO16232
・German Automobile Industry Association standard VDA19
・ISO4406 etc.
■Automatic contamination classification
・Automatically classifies contamination as reflective/non-reflective
・Evaluation of sources of contamination and possible potential risks
■Contamination confirmation editing function after measurement
・After measurement, the data is displayed in a list, and by simply clicking the measurement result of a specific contaminant with the mouse, the stage moves, allowing you to observe the foreign object in more detail.
・It is possible to delete items other than contamination and edit the results.
■Recommended for the following industries
Product functionality and service life are related to particle contamination, and quantitative detection is useful for improving manufacturing processes.
・Auto parts
・Electronic parts
・Secondary battery
・Conductive resin
·piston
·bearing
・Pharmaceutical industry, etc.
■Accurately without taking much time
Leica is the first company in the world to jointly develop automatic contamination inspection systems with several leading manufacturers in the automotive manufacturing field. By integrating a high-performance motorized microscope and software optimized for cleanliness inspection, we can easily and quickly measure particles using highly accurate microscopy. Leica Cleanliness Expert has been used in a wide range of industries, including the automotive industry, where high safety is required, as well as the materials/chemical industry, semiconductor industry, and electrical/electronic industry.
■Up to elemental analysis to identify the source of contamination
Equipped with the Leica LIBS module, after the Cleanliness Expert system classifies the particle shape and size of foreign particles, the target contaminants that meet the conditions (size, metal only, etc.) can be immediately analyzed using the LIBS analysis method. It is possible to analyze.
・No pre-processing required…No sample preparation such as vacuuming is required, and color information can be checked with good visibility while retaining color information.
・Quick result output...Compared to conventional SEM/EDX methods, anyone can obtain elemental analysis results in just a few seconds.
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Product
Optical microscope Automated cleanliness inspection, counting and measurement of contamination and foreign objects Automatic contamination Cleanliness Expert
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Handling Company
Meishin Koki Co., Ltd.
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Categories
1 Models of Optical microscope Automated cleanliness inspection, counting and measurement of contamination and foreign objects Automatic contamination Cleanliness Expert
| Product Image | Part Number | Price (excluding tax) | Accuracy | Additional features | Automatic analysis | Control | Drive | Epi-light illumination | Epi-light observation method | Eyepiece lens | Focus | Foreign matter separation | Imaging | Incident light electric control | Magnification range | Movement range | Navigation standards | Objective turret | Report creation | Reproducibility | Transmitted light Electric control | Transmitted light illumination | Transmitted light observation method | User settings | Wide range shooting |
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DM4 M |
Available upon quote | ±3μm |
Rich software features for motorized microscope functions Overview image acquisition, depth compositing, measurement, binarization Software for metal analysis such as steel inclusion testing, grain size analysis, phase separation, etc. |
Contamination editing: combination, separation Graph display: number distribution graph Automatic measurement: Maximum length, area, number, reflection/non-reflection judgment Length measurement: Manual length measurement/annotation of any contamination, simple height measurement |
Control unit for x, y direction (stage) movement |
Spindle | High power LED | BF (bright field), DF (dark field), Pol (polarization), DIC (differential interference interference), Fluo (fluorescence) *DF/DIC/Fluo are optional. | Can be | Manual, electric (Z-axis coupler specification) | Reflective (metal), non-reflective (non-metal), fiber (textile) | Leica microscope digital camera |
Electric filter turret (4 pieces) Contrast Manager: Light settings, brightness, and aperture automatically adjust according to mode Illumination Manager: Brightness is always adjusted to the optimum level even if you change the observation method or magnification |
1.25x~150x objective lens | 75 x 50mm |
Move from the measurement list to the counted foreign objects ISO16232, VDA19, ISO4406, DIN51455, USP788, SAE AS4059, NAS1638, user settings |
6 holes: Manual (coded) M32 for dark field 7 holes: Manual (coded) M25 for bright field |
Excel, PDF, raw data | <1μm |
Contrast Manager: Light settings, brightness, and aperture automatically adjust according to mode Illumination Manager: Brightness is always adjusted to the optimum level even if you change the observation method or magnification |
High power LED | BF (bright field), Pol (polarization), PH (phase contrast), DIC (differential interference) | Administrator, operator | Scanning circular and rectangular areas |
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About Company Handling This Product
- Japan