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■Scanning near-field optical microscope S-SNOM A system with the same specifications as nanoIR3 plus scattering SNOM (s-SNOM). Optical property imaging with a spatial resolution of 10 nm or less is now possible, making it an ideal solution for analyzing inorganic materials such as graphene, 2D materials, and nanoantennas. Combined with AFM-IR, it is applicable to a wide range of applications from organic to inorganic analysis. ■Features ・nanoIR3-s is equipped with s-SNOM function in addition to AFM-IR ・Provides s-SNOM images at 10nm, the same as AFM-IR ・Optimal solution for inorganic materials and semiconductor applications
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Anasys nanoIR3-sHandling Company
Bruker CorporationCategories
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