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  4. Conductive nanoprobe for prober (Unisoku Co., Ltd.)
Conductive nanoprobe for prober-P-100PtIr (P)
Conductive nanoprobe for prober-Unisoku Co., Ltd.

Conductive nanoprobe for prober
Unisoku Co., Ltd.

About This Product

Multi-probe probing of sample surfaces at the micro- and nanoscale is used in the research, development, and production fields of semiconductor devices, including the measurement of surface electrical properties for failure analysis of semiconductor devices. In recent years, with the miniaturization of device structures, the specifications required for inspection probes, such as sharper inspection probes and suppression of surface oxide films, have also increased. In addition, the need for such probes is increasing in various fields such as nanobiotechnology. In order to meet these needs, we have developed nanoprobes for contact testing that can be used for a variety of applications.

■Tip shape with small inclination angle and advantageous for multiple probes

The probe shape has a small inclination angle to prevent the probes from coming into contact with each other even if adjacent probes approach each other at an acute angle.

■Soft contact with the sample is possible

Platinum-iridium probes do not have an oxide film on their surfaces, so they can quickly become conductive upon contact. This minimizes damage to the sample and probe. (Excluding tungsten probe P-100W)

■Types of conductive nanoprobes for probers

・Platinum iridium probe model number: P-100PtIr (P) ・Tungsten probe model number: P-100WP

  • Product

    Conductive nanoprobe for prober

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1 Models of Conductive nanoprobe for prober

Image Part Number Price (excluding tax) Needle tip shape Wire rod Wire diameter Tip radius of curvature
Conductive nanoprobe for prober-Part Number-P-100PtIr (P)

P-100PtIr (P)

Available upon quote

Conical shape

Polycrystalline tungsten

0.5 mm dia.

20 nm or less

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About Company Handling This Product

Unisoku Co., Ltd.

  • Japan

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