Wafer compatible laser scanning imager
Opcell Co., Ltd.
About This Product
This is a third observation device that is neither a microscope nor a CCD camera. This is a device that takes images of large areas at high speed using a confocal optical system that uses laser raster scanning. Various objects (films, ceramics, glass, sapphire, metal surfaces, black rubber, etc.) can be easily observed and defects detected.
■Features
・A new observation device that overcomes the shortcomings of conventional microscopes, CCD cameras, and line sensors (no lighting equipment required)
・Newly developed dedicated scanning lenses (6 types) with a wide observation area (more than 100 times that of a microscope) and a long WD
・High contrast laser confocal optical unit
・The first raster scanning method in a laser confocal microscope optical system (equipped with a multi-scan function that allows you to acquire large-area images with long images)
・This is the first device that allows you to view enlarged images on a computer monitor.
■General usage
・High operating resolution (up to 20,000 points sampling per scan)
・Scanning speed 4,000 lines/sec or more
・The laser uses Blu-ray LD405nm (650 and 830nm are also available)
■Applications of laser scanning imager
・Observation and detection of surface defects on transparent films, glass, etc.
・Detection of micro-crack defects in ceramics, etc.
・Observation of peeling of deposited film, etc.
・Non-contact shape measurement of small diameter lenses and small molds
・Acquisition of precise 3D data over a large area
・Precise measurement of minute surface warpage
・Measurement and flaw inspection using precise interference fringes over a large area
・Observation of other objects that are difficult to see with an optical microscope
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Product
Wafer compatible laser scanning imager
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Handling Company
Opcell Co., Ltd.
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Categories
1 Models of Wafer compatible laser scanning imager
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Wafer compatible laser scanning imager |
Available upon quote |
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About Company Handling This Product
- Japan