Waha exterior inspection device (before dating)
Hubrain
About This Product
･ High -speed and high -precision inspection of the appearance defect generated in the wafer process ･ Daucing process
･ Image resolution can be selected according to the test accuracy. Macro test (about 10UM resolution or more)
･ Auto focus function (optional)
･ There are all numbers of marking mistakes (optional)
･ ID reading and mapping data output function (optional)
Buffer software
･ Inspection result map display function
･ NG chip enlarged display function
･ Defective classification display function (defective items/total inspection number/OK/NG)
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Product
Waha exterior inspection device (before dating)
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Handling Company
Hubrain
1 Models of Waha exterior inspection device (before dating)
| Product Image | Part Number | Price (excluding tax) | Device size | Target products (example) | camera | others | software |
|---|---|---|---|---|---|---|---|
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Waha exterior inspection device (before dating) |
Available upon quote | 1,350W × 1,350D × 1,800Hmm, excluding Patrite, HEPA | Various wafer, power semiconductor, CMOS image sensor, LED, photo diode | ・ 5 million pixel monochrome rational cameras (micro tests) ・ 12 million pixel monochrome rational cameras (macro tests) ・ 25 million pixel monochrome rational cameras (alignment) | Lens and lighting must be selected depending on the work and the contents of the test. | Multifunctional image inspection software HU-DRA |
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