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Waha exterior inspection device (before dating)
Hubrain


About This Product

・ High -speed and high -precision inspection of the appearance defect generated in the wafer process ・ Daucing process ・ Image resolution can be selected according to the test accuracy. Macro test (about 10UM resolution or more) ・ Auto focus function (optional) ・ There are all numbers of marking mistakes (optional) ・ ID reading and mapping data output function (optional) Buffer software ・ Inspection result map display function ・ NG chip enlarged display function ・ Defective classification display function (defective items/total inspection number/OK/NG)

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    Waha exterior inspection device (before dating)

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