Analysis and measurement equipment Surface analyzer Scanning X-ray photoelectron spectrometer (XPS/ESCA) PHI X-tool
ULVAC Sales Co., Ltd.
About This Product
■Summary
PHIX-tool is an automatic micro-XPS device that achieves high-performance XPS with easy operation.
Features
■Excellent operability
PHIX-tool software supports all types of XPS measurements with easy operation using a simple and intuitive touch panel.
Measurement operations can be freely selected from manual settings to fully automatic measurement (automatic qualitative, quantitative, analysis, and report creation), so it is suitable for all types of users, from those with XPS experience to those with no experience. In addition, by adopting a tablet PC, we have realized a smarter operating environment.
■Start measurement and create report automatically in 3 steps.
① Sample introduction ② Condition selection ③ Measurement start
■Automatic measurement/automatic report
Equipped with Auto-Z alignment (high-speed automatic height adjustment) function for analysis points and fully automatic neutralization function for insulator samples. Just by specifying the measurement position, everything from measurement to analysis of unknown samples is performed.
■Contents of automatic analysis
・Qualitative: Peak detection and identification
・Quantification: Automatic peak range setting and quantification
・Curve fitting: Curve fitting execution based on preset conditions
・Report: Automatic Japanese report creation function
■Various sample observation functions
PHI X-tool employs three functions for sample observation: a) intro camera image, b) live view camera image, and c) X-ray excited secondary electron image (SXI). By having these functions together, you can easily set the measurement position regardless of the size or shape of the sample.
■Detailed condition settings are easily achieved with intuitive operations.
a) Measurement mode selection screen
By selecting the mode, it is possible to set analysis conditions according to detailed materials and purposes.
b) Periodic table screen for selecting measurement elements
You can specify each photoelectron peak line and Auger peak.
c) Screen for setting narrow spectrum measurement conditions
You can set the pass energy, step, integration time, etc.
d) Comment input screen
File names and sample names can be entered in Japanese.
*There are other features as well.
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Product
Analysis and measurement equipment Surface analyzer Scanning X-ray photoelectron spectrometer (XPS/ESCA) PHI X-tool
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Handling Company
ULVAC Sales Co., Ltd.
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Categories
1 Models of Analysis and measurement equipment Surface analyzer Scanning X-ray photoelectron spectrometer (XPS/ESCA) PHI X-tool
| Product Image | Part Number | Price (excluding tax) |
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PHI X-tool |
Available upon quote |
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About Company Handling This Product
- Japan