Extending ultra-high-speed imaging using line illumination to the ultraviolet and deep ultraviolet UV/deep ultraviolet Raman microscopes RAMANtouch vioLa
Cosmo Trading Co., Ltd.
About This Product
This shortens measurement time and enables point scanning of the optimal path using only Raman scattering characteristics without prior sample information.
■New Raman imaging opened up by deep ultraviolet rays
Microscopy is always a battle with wavelength selection. The optimal optical system changes depending on the wavelength. Raman microscopes can use a variety of wavelengths as light sources, but until now it has been difficult to maintain performance at all wavelengths. This is because the glass used in optical systems exhibits different characteristics depending on the wavelength.
Especially in the ultraviolet region (light with a wavelength shorter than 400 nm), changes in glass properties are noticeable. Conventional Raman microscopes have had to accept deterioration in performance. This is because the advantages of observation in the ultraviolet region outweighed the disadvantages of performance degradation.
■Ramantouch vioLa's unique optical system
RAMANtouch vioLa only has the advantage of observing in the ultraviolet region. Ultraviolet observation with unprecedented efficiency and high spatial resolution opens up a new world of Raman imaging.
We will introduce some of the optical systems installed in RAMANtouch vioLa. In normal scanning optical systems, light is bent using a pair of lenses, but in RAMANTouch vioLa, the optical system is called a catadioptric system, and the light is bent using a reflector and a correction lens instead of a pair of lenses. Thanks to this, highly accurate scans can be performed even in deep ultraviolet light.
■UV Applications
Observation using ultraviolet light allows you to obtain information that could not be obtained with conventional Raman observation. Because ultraviolet light has a short penetration length (the distance that light reaches) in various materials, it is possible to obtain information only on the surface layer. It also enables observation with high spatial resolution while avoiding the effects of fluorescence, and enables wide bandgap photoluminescence (PL) observation.
■Observation example 1: Stress measurement of 6H-SiC
We measured the surface stress of SiC wafers. Comparing the optical microscope image and the Raman image reveals that tensile stress occurs in the defect areas that appear dark under the optical microscope, while compressive stress occurs between the defects. At a wavelength of 325 nm, only the outermost surface of SiC could be observed. The Raman shift peak of 789 cm-1 was used for observation. This peak corresponds to FTO (2/6) E2 of 6H-SiC.
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Extending ultra-high-speed imaging using line illumination to the ultraviolet and deep ultraviolet UV/deep ultraviolet Raman microscopes RAMANtouch vioLa
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Handling Company
Cosmo Trading Co., Ltd.
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1 Models of Extending ultra-high-speed imaging using line illumination to the ultraviolet and deep ultraviolet UV/deep ultraviolet Raman microscopes RAMANtouch vioLa
| Product Image | Part Number | Price (excluding tax) | Detector | Grating | Laser irradiation method | Laser wavelength | Option | Spectrometer focal length |
|---|---|---|---|---|---|---|---|---|
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RAMANtouch vioLa |
Available upon quote | Electronically cooled CCD 1,340 × 400 pixels, etc. | 300, 600, 1,200, 2,400, 3,600 g/mm | Point lighting/line lighting | 257nm, 266nm, 325nm, 355nm, 405nm, 457nm, 488nm, 532nm, etc. |
・Pinhole measurement ・High-precision peak shift measurement function ・Cooling heating stage |
550mm |
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About Company Handling This Product
- Japan