Unique beam scanning based on stochastic process theory and information theory Random scanning confocal Raman microscope RAMANwalk
Cosmo Trading Co., Ltd.
About This Product
This shortens measurement time and enables point scanning of the optimal path using only Raman scattering characteristics without prior sample information.
■Measurement time is significantly reduced despite point scanning.
The biggest weakness of Raman microscopes is the extremely long measurement time. We succeeded in solving this problem by using stochastic process theory and information theory. The laser beam is scanned along the optimal path without prior knowledge of the sample, and images can be obtained in 5 to 10 times the measurement time of conventional scanning Raman microscopes. *Patent pending
■High-speed screening without preprocessing
The scanning method included in RAMANwalk does not require any prior information. Even if the sample is difficult to find with a microscope, if there are characteristics in Raman scattering, the beam will automatically search as if it were alive and the necessary data can be obtained quickly. Although the entire information is not required, it is very effective for measuring samples that may be rejected if there are foreign substances.
■Equipped with everything in a compact and beautiful housing
RAMANwalk has achieved a compact system by using only a point scanning optical system. The compact system is implemented in a beautiful housing. It has a built-in optical system necessary for a Raman microscope and a motorized adjustment mechanism. By minimizing the effort required for analysis, we have achieved ease of use commensurate with its high speed.
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Unique beam scanning based on stochastic process theory and information theory Random scanning confocal Raman microscope RAMANwalk
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Handling Company
Cosmo Trading Co., Ltd.
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1 Models of Unique beam scanning based on stochastic process theory and information theory Random scanning confocal Raman microscope RAMANwalk
| Product Image | Part Number | Price (excluding tax) | Blackout cover | Detector | Diffraction grating | Dimensions (W×D×H) | Laser irradiation method | Laser wavelength | Option | Scanning method | Spatial resolution | Spectral measurement range | Spectral pixel resolution | Spectral resolution (FWHM) |
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RAMAN walk |
Available upon quote | With interlock | High sensitivity electronically cooled CCD 1,650 pixels | 600g/mm, up to 3 pieces installed at the same time (optional) | 304 × 829 × 448 mm | Point lighting | 1 wavelength or 2 wavelengths (selectable from 488 nm, 532 nm, 671 nm, 785 nm) |
XY electric stage pinhole measurement Polarized Raman measurement Low wavenumber measurement (50cm-1) Special peak shift measurement |
XY beam scan Z stage scan |
XY 350nm, Z 1,000nm (100x objective lens, 0.9N.A.) | 100cm-1~ | 0.74cm-1/pixel (@785nm, 1,200 g/mm) | 1.5cm-1 (@785 nm, 1,200 g/mm) |
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About Company Handling This Product
- Japan