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Unique beam scanning based on stochastic process theory and information theory Random scanning confocal Raman microscope RAMANwalk-RAMAN walk
Unique beam scanning based on stochastic process theory and information theory Random scanning confocal Raman microscope RAMANwalk-Cosmo Trading Co., Ltd.

Unique beam scanning based on stochastic process theory and information theory Random scanning confocal Raman microscope RAMANwalk
Cosmo Trading Co., Ltd.

Cosmo Trading Co., Ltd.'s Response Status

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100.0%

Response Time

24.3hours

Relatively Fast Response


About This Product

This shortens measurement time and enables point scanning of the optimal path using only Raman scattering characteristics without prior sample information.

■Measurement time is significantly reduced despite point scanning.

The biggest weakness of Raman microscopes is the extremely long measurement time. We succeeded in solving this problem by using stochastic process theory and information theory. The laser beam is scanned along the optimal path without prior knowledge of the sample, and images can be obtained in 5 to 10 times the measurement time of conventional scanning Raman microscopes. *Patent pending

■High-speed screening without preprocessing

The scanning method included in RAMANwalk does not require any prior information. Even if the sample is difficult to find with a microscope, if there are characteristics in Raman scattering, the beam will automatically search as if it were alive and the necessary data can be obtained quickly. Although the entire information is not required, it is very effective for measuring samples that may be rejected if there are foreign substances.

■Equipped with everything in a compact and beautiful housing

RAMANwalk has achieved a compact system by using only a point scanning optical system. The compact system is implemented in a beautiful housing. It has a built-in optical system necessary for a Raman microscope and a motorized adjustment mechanism. By minimizing the effort required for analysis, we have achieved ease of use commensurate with its high speed.

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    Unique beam scanning based on stochastic process theory and information theory Random scanning confocal Raman microscope RAMANwalk

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1 Models of Unique beam scanning based on stochastic process theory and information theory Random scanning confocal Raman microscope RAMANwalk

Image Part Number Price (excluding tax) Blackout cover Scanning method Spatial resolution Detector Dimensions (W×D×H) Diffraction grating Laser irradiation method Laser wavelength Spectral measurement range Spectral resolution (FWHM) Spectral pixel resolution Option
Unique beam scanning based on stochastic process theory and information theory Random scanning confocal Raman microscope RAMANwalk-Part Number-RAMAN walk

RAMAN walk

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With interlock

XY beam scan
Z stage scan

XY 350nm, Z 1,000nm (100x objective lens, 0.9N.A.)

High sensitivity electronically cooled CCD 1,650 pixels

304 × 829 × 448 mm

600g/mm, up to 3 pieces installed at the same time (optional)

Point lighting

1 wavelength or 2 wavelengths (selectable from 488 nm, 532 nm, 671 nm, 785 nm)

100cm-1~

1.5cm-1 (@785 nm, 1,200 g/mm)

0.74cm-1/pixel (@785nm, 1,200 g/mm)

XY electric stage
pinhole measurement
Polarized Raman measurement
Low wavenumber measurement (50cm-1)
Special peak shift measurement

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About Company Handling This Product

Response Rate

100.0%


Response Time

24.3hrs


Company Review

4.0
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