Measurement and analysis equipment Analyzer equipment Scanning probe microscope Atomic force microscope (AFM/SPM)
Mysec Co., Ltd.
About This Product
It is possible to observe three-dimensional surface shapes from micrometers to nanometers, which cannot be obtained with an optical microscope, as well as to observe physical properties (mechanical and electromagnetic properties).
■Applications
Surface shape measurement, viscoelasticity measurement, adsorption force measurement, friction force measurement, electrical property measurement, magnetic property measurement, etc.
-
Product
Measurement and analysis equipment Analyzer equipment Scanning probe microscope Atomic force microscope (AFM/SPM)
-
Handling Company
Mysec Co., Ltd.
-
Categories
1 Models of Measurement and analysis equipment Analyzer equipment Scanning probe microscope Atomic force microscope (AFM/SPM)
| Product Image | Part Number | Price (excluding tax) |
|---|---|---|
|
|
Atomic force microscope (AFM/SPM) |
Available upon quote |
Customers who viewed this product also viewed
Other products of Mysec Co., Ltd.
View more products of Mysec Co., Ltd.
About Company Handling This Product
- Japan