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  2. Observation Equipment
  3. Scanning Probe Microscopes
  4. Measurement and analysis equipment Analyzer equipment Scanning probe microscope Atomic force microscope (AFM/SPM) (Mysec Co., Ltd.)
Measurement and analysis equipment Analyzer equipment Scanning probe microscope Atomic force microscope (AFM/SPM)-Atomic force microscope (AFM/SPM)
Measurement and analysis equipment Analyzer equipment Scanning probe microscope Atomic force microscope (AFM/SPM)-Mysec Co., Ltd.

Measurement and analysis equipment Analyzer equipment Scanning probe microscope Atomic force microscope (AFM/SPM)
Mysec Co., Ltd.

Mysec Co., Ltd.'s Response Status

Response Rate

100.0%

Response Time

18.9hours

Relatively Fast Response

About This Product

It is possible to observe three-dimensional surface shapes from micrometers to nanometers, which cannot be obtained with an optical microscope, as well as to observe physical properties (mechanical and electromagnetic properties).

■Applications

Surface shape measurement, viscoelasticity measurement, adsorption force measurement, friction force measurement, electrical property measurement, magnetic property measurement, etc.

  • Product

    Measurement and analysis equipment Analyzer equipment Scanning probe microscope Atomic force microscope (AFM/SPM)

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1 Models of Measurement and analysis equipment Analyzer equipment Scanning probe microscope Atomic force microscope (AFM/SPM)

Image Part Number Price (excluding tax)
Measurement and analysis equipment Analyzer equipment Scanning probe microscope Atomic force microscope (AFM/SPM)-Part Number-Atomic force microscope (AFM/SPM)

Atomic force microscope (AFM/SPM)

Available upon quote

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About Company Handling This Product

Mysec Co., Ltd.

Response Rate

100.0%

Response Time

18.9hrs

  • Japan

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Scanning Probe Microscopes
Scanning Probe Microscopes　Mysec Co., Ltd.
Mysec Co., Ltd.

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