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Discussions in real time with simple operations high-speed line type drawback test device LS-70J-LS-70J
Discussions in real time with simple operations high-speed line type drawback test device LS-70J-TAKENAKA SYSTEM CO.,LTD.

Discussions in real time with simple operations high-speed line type drawback test device LS-70J
TAKENAKA SYSTEM CO.,LTD.

TAKENAKA SYSTEM CO.,LTD.'s Response Status

Response Rate

100.0%

Response Time

90.9hours


About This Product

overview ・ It is a defect detection device for line scan cameras for high -speed and high -resolution. ・ It can be connected to a Camera Link output line scan camera with abundant lineups from 8,192 to 2,048 pixels. feature ・ Data rates are 8 times that of conventional models, up to 400MHz. ・ Video waveform monitor function and shading function, line addition function, 3 × 3, 7 × 7 image processing filter, it is an easy -to -use inspection device. ・ The camera view of the camera can be divided into 16 divisions, and the color LCD monitor is used to make it easy to see the video waveform and setting screen. ・ Compatible with ground fluctuations and light volume changes. ・ Deflement simultaneous judgment function 4 times is equipped. ・ You can freely change the edge unusual zone with the automatic edge tracking function. ・ If our 8,192 pixel line scan cameras are connected, one line that requires two units can be used with one unit. -The data rate is 8 times, so it is possible to accommodate four times the line speed of the conventional model. Use ・ Detection of foreign substances, foam, and scratches generated in the glass manufacturing process ・ Filmfish eye, foreign matter, pinhole detection ・ Detection of paper sheets, black dots, colored stains, and foreign matter ・ Pin hole detection of iron and non -ferrous metals

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    Discussions in real time with simple operations high-speed line type drawback test device LS-70J

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1 Models of Discussions in real time with simple operations high-speed line type drawback test device LS-70J

Image Part Number Price (excluding tax) Compatible line scan camera Amplification department Setting part Contents of each function Operation peripheral temperature External dimensions weight power consumption Operating power supply Camera connection method output Gate signal Analog level judgment
Discussions in real time with simple operations high-speed line type drawback test device LS-70J-Part Number-LS-70J

LS-70J

Available upon quote

・ TL-8K35NCL number 8,192, MAX scan rate 40kHz, operation condition FULL8TAP × 50MHz = 400MHz ・ TL-8K35 NCL number 4,096 (during veneing), MAX scan rate 40kHz, operation condition MIDIUM4TAP × 50MHz = 200MHz / TL-4096NCL number 4,096, MAX scan rate 45kHz, operating condition MIDIUM4TAP × 50MHz = 200MHz ・ TL-4096NCL Number of pixels 2,048 (during plastic), MAX scan rate 45kHz, operation condition BASE2TAP Base2tap × 50MHz = 100MHz / TL-2048NCL number 2,048, MAX scan rate 45kHz, operation condition Base2tap × 50MHz = 100MHz

・ Swooding correction circuit ・ Light volume change tracking circuit (AGC) ・ line addition circuit (× 2,4,6) ・ Image processing filter (3 × 3), (7 × 7)

・ Defforced width setting 4 circuits ・ Due to drawback length setting 4 circuits ・ Inspection width setting (overall) ・ In -field division setting MAX16 split ・ Edge tracking non -sensitivity set ・ Running cycle setting

・ Wave shape monitor ・ Shading ・ Dawn display ・ Disturbing image ・ Various settings 0 走 走 種 種 種 種 種 種 種 種 種 種 種 種 種 種 種 種 種 種 種 種 種 種 種 種 種 種 種 種 種 種 種Communication 1000BASE drawback output, setting input, waveform display output, USB numeric key input, LCD display 320RGB × 240dots (color)

0 to 45 ° C (without condensation)

250 (H) x 110 (W) x 230 (d) mm

3kg

50W

AC85-220v50/60Hz

Cameralink method (Base, MediumFull)

Open collector 16 points

Inspection/stop command signal

Detection level judgment circuit 4 times

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About Company Handling This Product

Response Rate

100.0%


Response Time

90.9hrs

Company Overview

Takenaka System Co., Ltd., a company founded in 1975, based in Kyoto, Japan, is a manufacturer and supplier of...

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