Discussions in real time with simple operations high-speed line type drawback test device LS-70J-LS-70J
Discussions in real time with simple operations high-speed line type drawback test device LS-70J-TAKENAKA SYSTEM CO.,LTD.

Discussions in real time with simple operations high-speed line type drawback test device LS-70J
TAKENAKA SYSTEM CO.,LTD.


About This Product

overview ・ It is a defect detection device for line scan cameras for high -speed and high -resolution. ・ It can be connected to a Camera Link output line scan camera with abundant lineups from 8,192 to 2,048 pixels. feature ・ Data rates are 8 times that of conventional models, up to 400MHz. ・ Video waveform monitor function and shading function, line addition function, 3 × 3, 7 × 7 image processing filter, it is an easy -to -use inspection device. ・ The camera view of the camera can be divided into 16 divisions, and the color LCD monitor is used to make it easy to see the video waveform and setting screen. ・ Compatible with ground fluctuations and light volume changes. ・ Deflement simultaneous judgment function 4 times is equipped. ・ You can freely change the edge unusual zone with the automatic edge tracking function. ・ If our 8,192 pixel line scan cameras are connected, one line that requires two units can be used with one unit. -The data rate is 8 times, so it is possible to accommodate four times the line speed of the conventional model. Use ・ Detection of foreign substances, foam, and scratches generated in the glass manufacturing process ・ Filmfish eye, foreign matter, pinhole detection ・ Detection of paper sheets, black dots, colored stains, and foreign matter ・ Pin hole detection of iron and non -ferrous metals

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    Discussions in real time with simple operations high-speed line type drawback test device LS-70J




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1 Models of Discussions in real time with simple operations high-speed line type drawback test device LS-70J

Product Image Part Number Price (excluding tax) Amplification department Analog level judgment Camera connection method Compatible line scan camera Contents of each function External dimensions Gate signal Operating power supply Operation peripheral temperature Setting part output power consumption weight
Discussions in real time with simple operations high-speed line type drawback test device LS-70J-Part Number-LS-70J

LS-70J

Available upon quote ・ Swooding correction circuit ・ Light volume change tracking circuit (AGC) ・ line addition circuit (× 2,4,6) ・ Image processing filter (3 × 3), (7 × 7) Detection level judgment circuit 4 times Cameralink method (Base, MediumFull) ・ TL-8K35NCL number 8,192, MAX scan rate 40kHz, operation condition FULL8TAP × 50MHz = 400MHz ・ TL-8K35 NCL number 4,096 (during veneing), MAX scan rate 40kHz, operation condition MIDIUM4TAP × 50MHz = 200MHz / TL-4096NCL number 4,096, MAX scan rate 45kHz, operating condition MIDIUM4TAP × 50MHz = 200MHz ・ TL-4096NCL Number of pixels 2,048 (during plastic), MAX scan rate 45kHz, operation condition BASE2TAP Base2tap × 50MHz = 100MHz / TL-2048NCL number 2,048, MAX scan rate 45kHz, operation condition Base2tap × 50MHz = 100MHz ・ Wave shape monitor ・ Shading ・ Dawn display ・ Disturbing image ・ Various settings 0 走 走 種 種 種 種 種 種 種 種 種 種 種 種 種 種 種 種 種 種 種 種 種 種 種 種 種 種 種 種 種 種 種Communication 1000BASE drawback output, setting input, waveform display output, USB numeric key input, LCD display 320RGB × 240dots (color) 250 (H) x 110 (W) x 230 (d) mm Inspection/stop command signal AC85-220v50/60Hz 0 to 45 ° C (without condensation) ・ Defforced width setting 4 circuits ・ Due to drawback length setting 4 circuits ・ Inspection width setting (overall) ・ In -field division setting MAX16 split ・ Edge tracking non -sensitivity set ・ Running cycle setting Open collector 16 points 50W 3kg

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About Company Handling This Product

TAKENAKA SYSTEM CO.,LTD.

  • Japan
  • Since 1959
  • 23 employees

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