Optical inspection equipment Spectrophotometer Spectrometer OCM510 series that measures the quality and quantity of light sources-OCM-510MO
Optical inspection equipment Spectrophotometer Spectrometer OCM510 series that measures the quality and quantity of light sources-ND Seiko Co., Ltd.

Optical inspection equipment Spectrophotometer Spectrometer OCM510 series that measures the quality and quantity of light sources
ND Seiko Co., Ltd.

ND Seiko Co., Ltd.'s Response Status

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About This Product

The spectrometer OCM510 series is the optimal spectrophotometer for measuring the quality and quantity of light sources with high precision. ■Summary This spectrophotometer OCM-510 is equipped with a high-performance Czerny-Turner spectrometer, achieving high wavelength resolution and high wavelength accuracy despite its small size, and uses a highly accurate and highly sensitive line sensor as a detector. This makes it the perfect spectrophotometer for measurements that require high speed. In addition, a light guide fiber system is used for inputting the spectrometer, making it extremely easy to handle. ■Features ・Compact spectrophotometer that integrates a compact and high-performance spectrometer and detector ・OCM-510C: Ultra-low-level light metering is possible by using a cooled back FFT-CCD. ・Exposure time as short as 6ms ・Amplifier gain after sensor readout can be switched in the range of 1/2/4 times ・Supports pulse emission measurement with external synchronization signal output function ・Easy measurement possible by using a light guide fiber ・Equipped with mechanical shutter ・Spectrometer control and color calculation output function (supported by software from PC) ■Spectrometer characteristics OCM-510M,C is a small polychromator that uses the Czerny-Turner spectroscopy method and achieves high wavelength accuracy. The Czernyturner spectrometer consists of an entrance slit, two concave mirrors, and a plane grating.The parallel beam of light is incident on the plane grating, and the separated parallel beam is focused on a photodiode array detector using a concave mirror. By configuring a symmetrical optical arrangement for the grating that emits light, it works to return the curved spectral image to vertical. This is a spectroscopy method that improves wavelength resolution. In addition, the planar grating uses a braced holographic grating*, which is characterized by extremely low periodic errors and ghosts.

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    Optical inspection equipment Spectrophotometer Spectrometer OCM510 series that measures the quality and quantity of light sources

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4 Models of Optical inspection equipment Spectrophotometer Spectrometer OCM510 series that measures the quality and quantity of light sources

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Product Image Part Number Price (excluding tax) AD resolution Compatible wavelength Element cooling temperature Element size Exposure time External sync input External synchronization output Features Fiber length Fiber receiving area Fiber type Light detection element Linearity Mechanical shutter Number of light receiving elements Optical filter switching PC interface Power supply Repeatability Spectroscopic method Stray light Wavelength accuracy Wavelength resolution (FWHM)
Optical inspection equipment Spectrophotometer Spectrometer OCM510 series that measures the quality and quantity of light sources-Part Number-OCM-510MO

OCM-510MO

Available upon quote 16bit 300-800nm Nothing 25μm×2.5mm 5ms~10sec Start measurement with 5V~10V pulse input TTL/open collector output synchronized with sensor (μs order pulse photometry possible) High D range 1.5m standard/ (3m,5m optional) Φ1.0mm Quartz bundle fiber (φ200μm×15) φ12mm SUS tube NMOS 0.5% or less (2:1 incident light) 1.0% or less (10:1 incident light) Option 1,024ch Option USB2.0/LAN AC100V~AC240V (50/60Hz) 0.2% or less (2:1 incident light) 0.5% or less (10:1 incident light) Planar grating zernitarna arrangement 1% or less 0.2nm or less 2nm or less
Optical inspection equipment Spectrophotometer Spectrometer OCM510 series that measures the quality and quantity of light sources-Part Number-OCM-510CO

OCM-510CO

Available upon quote 16bit 300-800nm -5℃ 24μm×1.392mm 6ms~10sec Start measurement with 5V~10V pulse input TTL/open collector output synchronized with sensor (μs order pulse photometry possible) High sensitivity 1.5m standard/ (3m,5m optional) Φ1.0mm Quartz bundle fiber (φ200μm×15) φ12mm SUS tube Back-illuminated FFT-CCD 0.5% or less (2:1 incident light) 1.0% or less (10:1 incident light) Option 1,024ch×58ch Option USB2.0/LAN AC100V~AC240V (50/60Hz) 0.2% or less (2:1 incident light) 0.5% or less (10:1 incident light) Planar grating zernitarna arrangement 1% or less 0.2nm or less 2nm or less
Optical inspection equipment Spectrophotometer Spectrometer OCM510 series that measures the quality and quantity of light sources-Part Number-OCM-510CO-UN

OCM-510CO-UN

Available upon quote 16bit 200~950nm -5℃ 24μm×1.392mm 6ms~10sec Start measurement with 5V~10V pulse input TTL/open collector output synchronized with sensor (μs order pulse photometry possible) UV near infrared region 1.5m standard/ (3m,5m optional) Φ1.0mm Quartz bundle fiber (φ200μm×15) φ12mm SUS tube Back-illuminated FFT-CCD 0.5% or less (2:1 incident light) 1.0% or less (10:1 incident light) Option 1,024ch×58ch Option USB2.0/LAN AC100V~AC240V (50/60Hz) 0.2% or less (2:1 incident light) 0.5% or less (10:1 incident light) Planar grating zernitarna arrangement 1% or less 0.4nm or less 4nm or less
Optical inspection equipment Spectrophotometer Spectrometer OCM510 series that measures the quality and quantity of light sources-Part Number-OCM-510CO-VN

OCM-510CO-VN

Available upon quote 16bit 350~1,100nm -5℃ 24μm×1.392mm 6ms~10sec Start measurement with 5V~10V pulse input TTL/open collector output synchronized with sensor (μs order pulse photometry possible) Visible near infrared region 1.5m standard/ (3m,5m optional) Φ1.0mm Quartz bundle fiber (φ200μm×15) φ12mm SUS tube Back-illuminated FFT-CCD 0.5% or less (2:1 incident light) 1.0% or less (10:1 incident light) Option 1,024ch×58ch Option USB2.0/LAN AC100V~AC240V (50/60Hz) 0.2% or less (2:1 incident light) 0.5% or less (10:1 incident light) Planar grating zernitarna arrangement 1% or less 0.4nm or less 4nm or less

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