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Park NX20 is the most advanced nano-shape measurement tool for failure analysis and research and development on large samples.-NX20
Park NX20 is the most advanced nano-shape measurement tool for failure analysis and research and development on large samples.-Park Systems Japan Co., Ltd.

Park NX20 is the most advanced nano-shape measurement tool for failure analysis and research and development on large samples.
Park Systems Japan Co., Ltd.

Park Systems Japan Co., Ltd.'s Response Status

Response Rate

100.0%

Response Time

26.4hours

Relatively Fast Response


About This Product

As an FA engineer, you are expected to find results, but of course errors and mistakes caused by machines cannot be tolerated. The Park NX20 has earned a reputation as the world's most accurate large sample AFM and is highly regarded in the semiconductor and hard disk industries for data accuracy.

■More powerful failure analysis solution

It is equipped with unique features to uncover the causes behind device failures and develop more creative solutions. Its unparalleled accuracy provides high-resolution data so you can focus on your work. True Non-Contact™ mode scanning also keeps the tip sharper and longer, saving you time and money.

■ Easy-to-use operation method even for beginners

It has the industry's most user-friendly design and automated interface, saving you time and effort in tool usage and education. This allows you to focus on solving bigger problems and provides clear and timely failure analysis to your customers.

  • Product

    Park NX20 is the most advanced nano-shape measurement tool for failure analysis and research and development on large samples.

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1 Models of Park NX20 is the most advanced nano-shape measurement tool for failure analysis and research and development on large samples.

Image Part Number Price (excluding tax) Field of view Focus stage drive range Sample weight Sample size Z stage driving distance Z Scanner Height (Height) Noise Level Z scanner scan range XY stage drive range XY scanner scan range CCD pixel
Park NX20 is the most advanced nano-shape measurement tool for failure analysis and research and development on large samples.-Part Number-NX20

NX20

Available upon quote

840µm x 630µm (when using 10x objective lens)

15mm (electric)

<500g

Open space up to 100mm x 100mm, thickness up to 20mm (up to 200mm x 200mm available as an option)

25mm (electric)

30pm, 0.5kHz bandwidth/rms (typical)

15μm (30μm as option)

150mmx150mm (electric)

100µm x 100µm (50µm x 50µm as option)

1M pixels, 5M pixels (optional)

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About Company Handling This Product

Response Rate

100.0%


Response Time

26.4hrs

  • Japan

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