The most accurate and easy-to-use atomic force microscope (AFM) Park NX10-NX10
The most accurate and easy-to-use atomic force microscope (AFM) Park NX10-Park Systems Japan Co., Ltd.

The most accurate and easy-to-use atomic force microscope (AFM) Park NX10
Park Systems Japan Co., Ltd.


About This Product

Park NX10 provides reliable data at the highest nanoscale resolution. It can be easily operated at every stage, from sample setting to imaging, measurement, and analysis. With NX10, users have more time and better data to focus on innovative research. ■Park SmartScan™ automatic mode SmartScan™ automatic mode is made possible by Park Systems' proprietary technology. This software does all the imaging work for you, and is smart enough to automatically determine the best image quality and scan speed. By implementing this software, you can save time and cost, and expect better research results. ■Park Systems' crosstalk removal technology Park NX10 captures reliable and accurate data at the highest nanoscale resolution. The world's only true non-contact AFM that maintains sample surface integrity while extending tip life, and independent flexure-guided X/Y and Z scanners for high precision and resolution. Equipped with: ■Park advanced AFM mode Park Systems AFMs have a wide range of scan modes, allowing you to collect a wide variety of data accurately and efficiently. From the world's only true Non-Contact™ mode that preserves probe tip sharpness and sample integrity to advanced magnetic characterization, Park Systems offers the most innovative and accurate scanning modes in the AFM industry. Masu. ■Park NX10 SICM module The Park NX10 SICM (Scanning Ion Conductance Microscopy) module enables live imaging at the nanoscale for a wide range of applications including cell biology, analytical chemistry, electrophysiology, and neuroscience.

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    The most accurate and easy-to-use atomic force microscope (AFM) Park NX10

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1 Models of The most accurate and easy-to-use atomic force microscope (AFM) Park NX10

Product Image Part Number Price (excluding tax) CCD pixel Field of view Focus stage drive range Sample size Sample weight XY scanner scan range XY stage drive range Z Scanner Height (Height) Noise Level Z scanner scan range Z stage driving distance
The most accurate and easy-to-use atomic force microscope (AFM) Park NX10-Part Number-NX10

NX10

Available upon quote 1M pixels, 5M pixels (optional) 480µm x 360µm (when using 10x objective lens) 15mm (electric) Open space up to 100mm x 100mm, thickness up to 20mm 500g 50µm x 50µm (10µmx10µm or 100µmx100µm optional) 20mmx20mm (electric) 30pm, 0.5kHz bandwidth/rms (typical) 5μm (30μm as option) 25mm (electric)

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