All Categories

History

The most accurate and easy-to-use atomic force microscope (AFM) Park NX10-NX10
The most accurate and easy-to-use atomic force microscope (AFM) Park NX10-Park Systems Japan Co., Ltd.

The most accurate and easy-to-use atomic force microscope (AFM) Park NX10
Park Systems Japan Co., Ltd.

Park Systems Japan Co., Ltd.'s Response Status

Response Rate

100.0%

Response Time

26.4hours

Relatively Fast Response


About This Product

Park NX10 provides reliable data at the highest nanoscale resolution. It can be easily operated at every stage, from sample setting to imaging, measurement, and analysis. With NX10, users have more time and better data to focus on innovative research.

■Park SmartScan™ automatic mode

SmartScan™ automatic mode is made possible by Park Systems' proprietary technology. This software does all the imaging work for you, and is smart enough to automatically determine the best image quality and scan speed. By implementing this software, you can save time and cost, and expect better research results.

■Park Systems' crosstalk removal technology

Park NX10 captures reliable and accurate data at the highest nanoscale resolution. The world's only true non-contact AFM that maintains sample surface integrity while extending tip life, and independent flexure-guided X/Y and Z scanners for high precision and resolution. Equipped with:

■Park advanced AFM mode

Park Systems AFMs have a wide range of scan modes, allowing you to collect a wide variety of data accurately and efficiently. From the world's only true Non-Contact™ mode that preserves probe tip sharpness and sample integrity to advanced magnetic characterization, Park Systems offers the most innovative and accurate scanning modes in the AFM industry. Masu.

■Park NX10 SICM module

The Park NX10 SICM (Scanning Ion Conductance Microscopy) module enables live imaging at the nanoscale for a wide range of applications including cell biology, analytical chemistry, electrophysiology, and neuroscience.

  • Product

    The most accurate and easy-to-use atomic force microscope (AFM) Park NX10

Share this product


300+ people viewing

Last viewed: 9 hours ago


Free
Get started with our free quotation service - no cost, no obligation.

No Phone Required
We respect your privacy. You can receive quotes without sharing your phone number.

1 Models of The most accurate and easy-to-use atomic force microscope (AFM) Park NX10

Image Part Number Price (excluding tax) Field of view Focus stage drive range Sample weight Sample size Z stage driving distance Z Scanner Height (Height) Noise Level Z scanner scan range XY stage drive range XY scanner scan range CCD pixel
The most accurate and easy-to-use atomic force microscope (AFM) Park NX10-Part Number-NX10

NX10

Available upon quote

480µm x 360µm (when using 10x objective lens)

15mm (electric)

500g

Open space up to 100mm x 100mm, thickness up to 20mm

25mm (electric)

30pm, 0.5kHz bandwidth/rms (typical)

5μm (30μm as option)

20mmx20mm (electric)

50µm x 50µm (10µmx10µm or 100µmx100µm optional)

1M pixels, 5M pixels (optional)

Customers who viewed this product also viewed

Reviews shown here are reviews of companies.

See More Scanning Probe Microscopes Products

Other products of Park Systems Japan Co., Ltd.

Reviews shown here are reviews of companies.


View more products of Park Systems Japan Co., Ltd.

About Company Handling This Product

Response Rate

100.0%


Response Time

26.4hrs

  • Japan

This is the version of our website addressed to speakers of English in the United States. If you are a resident of another country, please select the appropriate version of Metoree for your country in the drop-down menu.

Copyright © 2025 Metoree